Texturization technology of solar battery

A solar cell and process technology, applied in the field of solar cells, can solve problems such as damage and open-circuit voltage loss, and achieve the effect of improving short-circuit current and high module efficiency

Inactive Publication Date: 2012-10-24
TRINA SOLAR CO LTD
View PDF3 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to ensure production capacity in mass production, high RF power (>25KW) is used to increase the etching rate, but high RF power will cause high damage layer, resulting in loss of open circuit voltage

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0007] A kind of texturing process of solar cell, has following steps:

[0008] a. Select the radio frequency power as 27Kw, and pass Cl into the reaction chamber 2 , SF 6 and O 2 Gas, the gas proportion is Cl 2 : SF 6 :O 2 =1:2:2, plasma bombardment on the surface of the silicon wafer, the process time is 70s;

[0009] b. Select the radio frequency power as 15Kw, and pass CL into the reaction chamber 2 and SF 6 Gas, the gas proportion is Cl 2 : SF 6 =1:2, plasma bombardment on the surface of the silicon wafer, the process time is 25s;

[0010] c. Use HF, HNO 3 and CH 3 The mixture of COOH, the mixture ratio is: HF: HNO 3 :CH 3 COOH=1:13:8, cleaning the silicon wafer etched in step b, so that the reflectance of the silicon wafer after cleaning is less than 14%.

[0011] The process time and gas flow in step a and step b can be adjusted according to the reflectivity and uniformity, and the reflectivity after controlling RIE is less than 8%.

[0012] After step a,...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
reflectanceaaaaaaaaaa
Login to view more

Abstract

The invention discloses a texturization technology of a solar battery, which adopts reactive ion etching, and comprises the following steps of: a. selecting the radio-frequency power of 25-30Kw, filling gases including Cl2, SF6 and O2 into a reaction cavity, and carrying out plasma bombardment on the surface of a silicon slice, wherein the technology time is 60-80s; b. selecting the radio-frequency power of 12-18Kw, filling gases including Cl2 and SF6 into the reaction cavity, and carrying out plasma bombardment on the surface of the silicon slice, wherein the technology time is 20-30s; and c. cleaning the silicon slice etched in the step by mixed liquid of HF, HNO3 and CH3COOH. Based on the original reactive ion etching (RIE) technology, one-step low radio-frequency power etching can be added, the plasma bombardment is carried out on the surface of the silicon slice, and the gases including Cl2 and SF6 are only filled in the process, so that Cl2 and SF6 have the function of effectively etching a damaged layer under the condition of low power radio frequency since the gas of O2 does not exist; and therefore, on the premise of guaranteeing the open-circuit voltage, the short-circuit current is improved, and higher component efficiency can be obtained.

Description

technical field [0001] The invention relates to the technical field of solar cells, in particular to a texturing process of solar cells which can reduce the damage layer of the etching process. Background technique [0002] Reactive Ion Etching (RIE for short) is an etching that combines physical ion bombardment and chemical reaction. This method has the dual advantages of anisotropy and high etching selectivity. The etching is mainly achieved by chemical reaction to obtain high selectivity. Adding ion bombardment has two functions: one is to destroy the atomic bond on the surface of the etched material to accelerate the reaction rate. The second is to knock off the product or polymer (Polymer) redeposited on the etched surface, so that the etched surface can be in contact with the etching gas again. The achievement of anisotropic etching depends on redeposited products or polymers, which are deposited on the etching pattern, and the deposits on the surface can be removed ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/18C23F4/00B08B3/08
CPCY02P70/50
Inventor 钟明
Owner TRINA SOLAR CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products