Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

MOSFET (metal oxide semiconductor field effect transistor) and manufacturing method thereof

A manufacturing method, semiconductor technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc.

Active Publication Date: 2013-01-02
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
View PDF5 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the above-mentioned SOI MOSFET with a back gate must be grounded or biased at a predetermined potential during operation, thus requiring additional chip area for providing an electrical contact to the back gate, for example for forming additional channels and wiring

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • MOSFET (metal oxide semiconductor field effect transistor) and manufacturing method thereof
  • MOSFET (metal oxide semiconductor field effect transistor) and manufacturing method thereof
  • MOSFET (metal oxide semiconductor field effect transistor) and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings. In the various figures, identical elements are indicated with similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale.

[0016] In the following, many specific details of the present invention are described, such as device structures, materials, dimensions, processing techniques and techniques, for a clearer understanding of the present invention. However, the invention may be practiced without these specific details, as will be understood by those skilled in the art. Unless otherwise specified below, various parts in the semiconductor device may be composed of materials known to those skilled in the art.

[0017] In this application, the term "semiconductor structure" refers to the general designation of the entire semiconductor structure formed in various steps of manufacturing a semiconductor device...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an MOSFET (metal oxide semiconductor field effect transistor) and a manufacturing method thereof. The MOSFET comprises a semiconductor substrate, a first insulating buried layer on the semiconductor layer, a back gate formed in a semiconductor layer on the first insulating buried layer, a second insulating buried layer on the first semiconductor layer, source / drain areas formed in a second semiconductor layer on the second insulating buried layer, a gate on the second semiconductor layer, and electric connection for the source / drain areas, the gate and the back gate. The back gate is located in one of the source / drain areas and below a groove area and not located below the other one of the source / drain areas. The electric connection includes a common conductive channel of the back gate and the source / drain areas. The short-channel channel inhibition effect is improved by the aid of the asymmetrical back gate of the MOSFET, and the area of a chip is reduced by the common conductive channel.

Description

technical field [0001] The present invention relates to a MOSFET and a manufacturing method thereof, more particularly, to a MOSFET with a back gate and a manufacturing method thereof. Background technique [0002] An important development direction of integrated circuit technology is to scale down the size of metal-oxide-semiconductor field-effect transistors (MOSFETs) to improve integration and reduce manufacturing costs. However, it is well known that short-channel effects occur as the size of MOSFETs decreases. As the size of the MOSFET is scaled down, the effective length of the gate is reduced, so that the proportion of depletion layer charge that is actually controlled by the gate voltage is reduced, so that the threshold voltage decreases as the channel length decreases. [0003] Yan et al. proposed in "Scaling the Si MOSFET: From bulk to SOI to bulk" (IEEE Trans. Elect. Dev., Vol. 39, p. 1704, July 1992), in SOI MOSFET, by A ground plane (that is, a grounded back ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/336H01L21/28H01L29/78H01L29/06H01L29/423
CPCH01L29/06H01L29/78603H01L29/78648H01L29/78H01L29/66772H01L21/76264H01L21/28H01L29/423
Inventor 朱慧珑梁擎擎尹海洲骆志炯
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products