High etching rate non-residue acidic aluminum etching solution and its preparation process

An etching rate and no residue technology, which is applied in the field of aluminum etching solution composition and its preparation process, can solve problems such as difficulty in controlling etching angle and etching amount, slow etching speed, affecting product yield and etching rate, etc., and achieves improved wettability. Effect of wet and etch uniformity, improved etch angle, reduced side etch amount

Active Publication Date: 2016-03-09
JIANGYIN RUNMA ELECTRONICS MATERIAL
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The book "Microfabrication Technology" published by Chemical Industry Press in 2004 gave a chemical etching solution for aluminum, which is mainly an aqueous solution composed of phosphoric acid and nitric acid. The disadvantage of this etching solution is that the etching speed is slow
That is, the etching speed of the molybdenum-aluminum etching solution composition is slow when etching a single aluminum metal film
In the process of etching pure aluminum materials with etching solution, it is often difficult to control the etching angle and etching amount, which affects the product yield and etching rate

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High etching rate non-residue acidic aluminum etching solution and its preparation process
  • High etching rate non-residue acidic aluminum etching solution and its preparation process

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The specific implementation of the present invention will be further described below in conjunction with the examples. The following examples are only used to illustrate the technical solutions of the present invention more clearly, but not to limit the protection scope of the present invention.

[0031] The invention is an acidic aluminum etching solution with high etching rate and no residue. The composition of the aluminum etching solution can be uniformly mixed with phosphoric acid, acetic acid, nitric acid, potassium chloride, metal nitrate, surfactant and pure water.

[0032] Wherein, the weight percentage of each raw material in the raw materials is prepared according to the components in the table respectively, and the rest is pure water; when the purity of raw materials changes, its proportioning should be adjusted.

[0033] Wherein, the purity of said phosphoric acid, acetic acid, and nitric acid can be respectively: 85.5% of phosphoric acid, 99.8% of acetic a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
pore sizeaaaaaaaaaa
particle sizeaaaaaaaaaa
purityaaaaaaaaaa
Login to view more

Abstract

The invention relates to a high etching rate no-residue acid aluminum etching liquid, which is characterized by comprising phosphoric acid, acetic acid, nitric acid, an inorganic chlorine group compound, an inorganic nitrate compound, a surfactant and pure water, wherein the surfactant is a mixture of an anionic surfactant and a polyoxyethylene nonionic surfactant. The process comprises the following steps of: weighing in a ratio; adding the phosphoric acid into a material mixing tank, adding the acetic acid with stirring, stirring the phosphoric acid and the acetic acid uniformly, adding the nitric acid with stirring because a great amount of heat is released when concentrated nitric acid is diluted, and mixing the phosphoric acid, the acetic acid and the nitric acid uniformly; adding potassium chloride or potassium nitrate and the surfactant into the uniformly mixed phosphoric acid, acetic acid and nitric acid, adding the pure water, and stirring; and filtering the mixture through a filter to obtain the aluminum etching liquid. The etching liquid has high etching rate for metal aluminum, ensures stable reaction and no residue, and avoids a lateral etching phenomenon basically.

Description

technical field [0001] The invention relates to an aluminum etchant composition for etching an aluminum film and a preparation process thereof, which are used in, for example, the formation of wiring of electronic components, etc., and more specifically, are designed to be used for etching components in semiconductor devices such as semiconductor elements and liquid crystals. An aluminum etchant composition for display elements and a preparation process thereof. Background technique [0002] In recent years, there has been an increasing need for electrode and gate wiring materials with higher precision in micro-assembly for semiconductor devices such as semiconductor elements and liquid crystal display elements, and it is recommended to use metal materials with lower resistance. Aluminum is a light metal with low density. It is the most important wire material in semiconductor manufacturing. It has the advantages of low resistance, easy deposition and etching. The conductivi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): C23F1/20
Inventor 戈士勇
Owner JIANGYIN RUNMA ELECTRONICS MATERIAL
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products