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Imaging plate (IP) based transmission electron microscope imaging scanning system and control method thereof

A technology of transmission electron microscopy and imaging scanning, applied in the field of electronic imaging, can solve the problems of small film production, poor quality, environmental pollution, etc., and achieve the effect of shortening the image acquisition time, improving the resistance to strong radiation, and eliminating the waste of resources.

Inactive Publication Date: 2013-02-20
PEKING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the prior art, film is used for exposure and imaging, but at present, with the increasing popularity of digital products, the production quantity of film is less and less, and the quality is poor, which makes the imaging effect of film not good
Further, the film can only be operated in a dark room without natural light, and the film cannot be reused, and the process of developing the film also pollutes the environment
Therefore, it greatly affects the application and imaging effect of transmission electron microscopy.

Method used

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  • Imaging plate (IP) based transmission electron microscope imaging scanning system and control method thereof
  • Imaging plate (IP) based transmission electron microscope imaging scanning system and control method thereof
  • Imaging plate (IP) based transmission electron microscope imaging scanning system and control method thereof

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Embodiment 1

[0031] Such as figure 2 As shown, in this embodiment, the scanning device includes: a laser light source 21, a receiver 22, an extinction lamp 23, a transmission mechanism 24, a computer and a housing 25; wherein, the housing 25 is divided into an excitation collection area A and an extinction area B , the laser light source 21 and the receiver 22 are arranged in the excitation collection area A, and the extinction lamp 23 is arranged in the extinction area B; the upper surface of one end of the transmission mechanism 24 is provided with a splice box 152, and the exposed IP imaging plate is placed in the splice box In 152, the lower surface of the other end is provided with a film feeding box 151; the IP imaging plate is ejected from the slit at the bottom of the film box 152, and is transported to the excitation collection area A by the transmission mechanism 24, and the laser light source 21 emits laser light to stimulate the IP imaging The photosensitive material on the bo...

Embodiment 2

[0040] In this embodiment, the scanning device is built in the photographing chamber 15 of the transmission electron microscope, and the IP imaging plate is directly placed on the transmission mechanism 24, and the photographing chamber 15 is divided into an excitation collection area A, an extinction area B and a photographing area C. The scanning device comprises: a laser light source 21, a receiver 22, a extinction lamp 23, a transmission mechanism 24 and a computer; wherein, the laser light source 21 and the receiver 22 are arranged in the excitation collection area A, and the extinction lamp 23 is arranged in the extinction area B; The single IP imaging plate is transported to the excitation and collection area A by the transmission mechanism, the laser light source 21 emits laser light to excite the photosensitive material on the IP imaging plate, and obtains an optical signal of a corresponding wavelength, and the receiver 22 collects the optical signal and converts it in...

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Abstract

The invention discloses an IP based transmission electron microscope imaging scanning system and a control method thereof. The transmission electron microscope imaging scanning system comprises a transmission electron microscope and a scanning device, wherein an IP is used in the transmission electron microscope, an electron beam penetrates through a sample and is exposed on the IP to form an image, and the scanning device conducts image scanning on the exposed IP and directly generates digital information of the image. According to the system and the method, the IP is used, and the exposure time is short, so that the sensitivity of the transmission electron microscope is improved, the operation is fast, the image contrast degree is high, the image stored in the IP can be maintained for more than 7 days, the IP can be operated in a normal visible light environment and is convenient to use, information in the IP can be selectively read repetitively, and the exposed IP can be used repetitively for almost twenty thousand times after being subjected to extinction. Thus, by the aid of the system and the method, details of the image can be observed conveniently, simultaneously, resource waste and environmental pollution can be eliminated, and the measurement precision can be improved.

Description

technical field [0001] The invention relates to the field of electronic imaging, in particular to a transmission electron microscope imaging scanning system based on an IP imaging plate and a control method thereof. Background technique [0002] Transmission electron microscopy is a microscope with high resolution and high magnification. It is an important means of material science research and can provide information on the organizational structure, crystal structure and chemical composition of materials. Generally, the resolution of the transmission electron microscope is 0.1-0.2nm, and the magnification is tens of thousands to hundreds of thousands of times. The working principle of the transmission electron microscope in the prior art is as follows: the illumination system emits electron beams, which irradiate the samples in the sample chamber; the electron beams after passing through the samples carry the internal structure information of the samples, pass through the i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/22
Inventor 张焱贾春燕陈晶冉书能刘国超李增杰
Owner PEKING UNIV