Wafer level chip size package and manufacturing method thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- BEIJING UNIV OF TECH
- Publication Date
- 2013-04-03
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The present invention relates to a wafer level chip scale package and a method of manufacturing said wafer level chip scale package. The packaging structure and manufacturing method described above can be preferably used for image sensors or MEMS devices. Background technique
[0002] Wafer-level packaging (WLP) is a type of IC packaging. As an advanced packaging technology, all process steps are completed before the wafer is sliced. Wafer-level chip-scale packaging (WLCSP) is a combination of wafer-level packaging (WLP) and chip-scale packaging (CSP). Packaging, and on-wafer interconnect bumping and testing. It is precisely because this packaging is different from the traditional packaging method (cutting first and then packaging and testing), wafer-level chip-scale packaging (WLCSP) not only significantly reduces the packaged volume size, reduces packaging costs, and improves packaging efficiency. And more in line with the requirements of high-den...