Testing method of single event functional interruption of Spacewire circuit

A test method and single-particle technology, applied in digital circuit testing, electronic circuit testing, etc., can solve the problems of inability to correctly evaluate the radiation resistance of microelectronic devices, inability to improve the radiation resistance of microelectronic devices, etc., to improve operability and efficiency, reduce operation links, and realize the effect of current monitoring

Active Publication Date: 2013-05-01
BEIJING MXTRONICS CORP +1
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Problems solved by technology

In recent years, it has been found that the single event effect has a more significant impact on the working performance of the device, and its damage mode is becoming more and more complicated. There are more and more forms of function interruption cau

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  • Testing method of single event functional interruption of Spacewire circuit
  • Testing method of single event functional interruption of Spacewire circuit
  • Testing method of single event functional interruption of Spacewire circuit

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Embodiment Construction

[0020] like figure 1 Shown is the flowchart of the method of the present invention.

[0021] Spacewire is used to transmit data in aerospace circuits, and the definition of single event function interruption is that the function of the circuit is abnormal under the irradiation environment, resulting in interruption. Aiming at the single particle function interruption test of the Spacewire circuit, the method of the present invention firstly establishes a communication link of two Spacewire circuits, and two FPGAs communicate through the two Spacewire circuits to realize mutual transmission of data. The schematic diagram of the data interaction between two Spacewires when the single event function is interrupted is detected. figure 2 Shown, where SpacewireB is the device to be irradiated. During the irradiation test, FPGA chip A sends data packets to FPGA chip B (controlling the irradiated Spacewire circuit B) through Spacewire A, and after FPGA chip B receives the data, the...

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Abstract

The invention discloses a testing method for single event functional interruption of a Spacewire circuit, which comprises the following steps that firstly two test systems are established respectively using an SPARC V8 processor and the Spacewire circuit, and the two test systems establish data transmission channels by each Spacewire circuit; then the Spacewire circuit B is arranged in a particle irradiation environment; the data transmission channels are set as that the test system A sends data to the test system B; after receiving the data, the test system B forwards the received data to the test system A again; and after data transmission is started, if the test system A cannot send the data to the test system B or the test system A cannot acquire the forwarded data from the test system B, the single event functional interruption occurs on the Spacewire circuit B, and then a reason for functional interruption is analyzed according to the read-back data of a control register of the Spacewire circuit B. The method can provide the basis for correlation research of a single event effect and a microelectronic device.

Description

technical field [0001] The invention relates to a method for testing and verifying the anti-single particle capability of a microelectronic device. Background technique [0002] With the rapid development of semiconductor technology, the integration of microelectronic devices used in spacecraft continues to increase, and spacecraft gradually use more large-scale integrated circuits. As the feature size and operating voltage of devices are getting smaller and smaller, correspondingly, the critical charge is getting smaller and smaller, and the single event effect is becoming more and more obvious. In recent years, it has been found that the single event effect has a more significant impact on the working performance of the device, and its damage mode is becoming more and more complicated. There are more and more forms of function interruption caused by the single event effect. Therefore, it is impossible to correctly evaluate the radiation resistance of microelectronic devic...

Claims

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Application Information

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IPC IPC(8): G01R31/317
Inventor 陈莉明董攀郑宏超飞海东王兴友祝长民范隆岳素格杜守刚马建华王煌伟陈茂鑫文圣泉毕潇
Owner BEIJING MXTRONICS CORP
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