Method for etching through hole
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- ADVANCED MICRO FAB EQUIP INC CHINA
- Publication Date
- 2015-04-08
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Abstract
Description
technical field
[0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a through hole etching method. Background technique
[0002] Since the copper process was used to replace the aluminum process in the mid-1990s, the advantages of the copper process have remained basically unchanged: copper has low resistance and good electrical conductivity. Even stronger current carrying capacity can be made smaller and denser at the same time. In addition, copper wires can be made thinner, thereby reducing mutual interference between adjacent wires.
[0003] The copper process uses an embedded process to obtain patterned wires, and the upper and lower copper wires are connected through micro-vias. In order to get these vias, another layer of photolithography and etching steps are required, and the way the industry usually handles it is to planarize and clean the copper metal, and then deposit a layer of silicon nitride or silicon carbide ...