Image embedded processing system and obtaining and positioning method for low-light image light spots

A processing system and image embedding technology, applied in the direction of processor architecture/configuration, optical device, measuring device, etc., can solve the problems of heavy instrument, inconvenient to use and carry, difficult to meet application requirements, etc., and reduce the volume. , the effect of increasing the degree of portability

Inactive Publication Date: 2013-09-04
FUDAN UNIV
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Problems solved by technology

For example, based on the computer and image sensor CCD or CMOS new autocollimator, its limitation is that it cannot be separated from the limitation of the computer, the instrument is heavy, an

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  • Image embedded processing system and obtaining and positioning method for low-light image light spots
  • Image embedded processing system and obtaining and positioning method for low-light image light spots
  • Image embedded processing system and obtaining and positioning method for low-light image light spots

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Example Embodiment

[0027] In order to make the present invention more comprehensible, a preferred embodiment is described in detail below in conjunction with the accompanying drawings.

[0028] figure 1 It is a schematic diagram of the structure of the digital collimator autocollimator system provided by the present invention. The entire measuring device includes five parts: a self-collimating optical device, an image sensor device, a low-illuminance image processing platform, an output circuit unit and a display terminal. In the overall system design, a base with multi-directional adjustable function can be used to carry the self-collimating optical device to facilitate the alignment of the optical path and adapt to various working environments. In order to ensure the detection accuracy, the light hole design is small. The present invention allows the use of small light holes to make the detector work under low illumination conditions, which is beneficial to improve the detection accuracy of the sy...

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Abstract

The invention belongs to the technical field of precise metering instruments, and particularly relates to an image embedded processing system and an obtaining and positioning method for low-light image light spots. The invention is based on a CMOS (complementary metal oxide semiconductor) or CCD (charge coupled device) image device for obtaining a low-light image, and constructs the embedded image processing system taking an FPGA (field programmable gate array), a DSP (digital signal processor) and a DDR3 as main chips. In algorithm, a filtering algorithm combining a morphology filtering operator and a mid-value filtering operator are is adopted for filtering the image; and meanwhile, an overall image dynamic range adjuster aiming at the characteristics of the low-light image and an enhancer aiming at the contrast of local characteristics are designed. The light spot detecting and positioning method comprises the steps of sectioning the image firstly, performing fast detecting and primary positioning on the light spots by a region projection algorithm, and performing gray level fitting treatment on a locked detecting region to compute the sub-pixel-level position coordinate of a target. The image embedded processing system and the obtaining and positioning method for the low-light image light spots have the characteristics of strong real time performance and high accuracy, and are suitable for the detecting and positioning of the image target of a low-light image device.

Description

technical field [0001] The invention belongs to the technical field of precision measuring instruments, and in particular relates to an image embedded processing system and a low-illuminance image spot acquisition and positioning method, so as to realize precise measurement of shape and position and calculation of angle offset. Background technique [0002] The photoelectric self-collimation device is a high-precision angle measuring instrument. It combines optical self-collimation imaging technology, detector array technology and image processing technology to realize the precision of minute / second level change of plane angle within a certain range. Measurement. Due to its unique advantages in realizing small-angle multi-dimensional and non-contact measurement, it is widely used in the measurement of the straightness of the guide rail platform, the flatness of the precision platform, the shape and position tolerance of optical components, and the integration of optical syst...

Claims

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Application Information

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IPC IPC(8): G06T1/20G01B11/26
Inventor 徐敏钟平
Owner FUDAN UNIV
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