Schottky semiconductor device with charge compensation and manufacturing method thereof
A charge compensation and conductive semiconductor technology, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, circuits, etc., can solve the problems of fast turn-on and turn-off speed, low forward turn-on voltage, and large reverse leakage current.
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Embodiment 1
[0022] figure 1 It is a sectional view of a Schottky semiconductor device with charge compensation of the present invention, combined below figure 1 The semiconductor device of the present invention will be described in detail.
[0023] A Schottky semiconductor device with charge compensation, comprising: a substrate layer 1, which is an N conductivity type semiconductor silicon material, and the doping concentration of phosphorus atoms is 1E19 / CM 3 , on the lower surface of the substrate layer 1, the electrodes are drawn out through the lower surface metal layer 11; the first conductive semiconductor material 3, located on the substrate layer 1, is a semiconductor silicon material of N conductivity type, and the doping concentration of phosphorus atoms is 1E16 / CM 3 ; The polycrystalline second conductive semiconductor material 4, located in the first conductive semiconductor material 3, is a polycrystalline semiconductor silicon material of P conductivity type, and the dopin...
Embodiment 2
[0032] FIG. 2 is a cross-sectional view of a Schottky semiconductor device with charge compensation according to the present invention. The semiconductor device of the present invention will be described in detail below with reference to FIG. 2 .
[0033] A Schottky semiconductor device with charge compensation, comprising: a substrate layer 1, which is an N conductivity type semiconductor silicon material, and the doping concentration of phosphorus atoms is 1E19 / CM 3 , on the lower surface of the substrate layer 1, the electrodes are drawn out through the lower surface metal layer 11; the first conductive semiconductor material 3, located on the substrate layer 1, is a semiconductor silicon material of N conductivity type, and the doping concentration of phosphorus atoms is 1E16 / CM 3 ; The second single-crystal conductive semiconductor material 6, located in the first conductive semiconductor material 3, is a polycrystalline semiconductor silicon material of P conductivity typ...
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