Uniaxial two-way micro mechanical measurement device and method for scanning micro environment

A uniaxial, bidirectional, scanning microscopy technique, used in measuring devices, using stable bending force to test material strength, and using stable tension/pressure to test material strength, etc. Implementation, expensive instruments, etc.

Active Publication Date: 2013-12-25
TSINGHUA UNIV +1
View PDF4 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although these testing machines are closer to the micro-scale in terms of load, displacement range and resolution compared with the previous macro testing machines, they still mainly use the principle of traditional material testing machines. And the displacement is much larger than the range required by micro-nano materials, and the instrument is expensive
On the other hand, in view of the difficulties of commercial experimental machines, researchers at home and abroad have developed some experimental devices for the mechanical properties of micro-nano materials with more advanced functions and performances according to their own needs. The system is not a complet

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Uniaxial two-way micro mechanical measurement device and method for scanning micro environment

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0026] The present invention provides a uniaxial bidirectional micromechanics measurement device and measurement method for scanning a microscopic environment. The following takes uniaxial biaxial stretching detection under a SEM microscope system as an example, and the principle and specific details of the present invention are described in conjunction with the accompanying drawings. The structure and tensile testing methods are further explained.

[0027] Such as figure 1 As shown, the integral support unit 13 is a rectangular aluminum alloy flat plate (175mm×95mm×7mm) with silver metallic paint sprayed on the surface. The integral support unit 13 is installed on the SEM sample stage base 14 with two positioning pins between them 16. Three M4-20 hexagon socket screws 12 are connected. A circular hole with a diameter of 48 mm is provided at the center of the upper surface of the integral support unit 13, and the SEM sample stage 15 passes through the central circular hole of th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the fields of micro-nano mechanics and precision machinery, and in particular relates to a uniaxial two-way micro mechanical measurement device and method for a scanning micro environment. According to the device, symmetrical coordinate type three-dimensional coarse-tuning translation stages, symmetrical fine-tuning three-dimensional moving precision platforms and a sample platform are installed on a main support unit. Through the control operation of a control system and a manipulation unit, the device can be used for detecting micro-nano characteristic scale materials and a structural mechanical property, and can realize one-way centering stretch, compressing, bending and vibration measurement and micro-nano scale sample surface deformation and micro-structural evolution detection. The device can be repeatedly used and can combine a digital image/speckle correlation technique, an image processing technique or a micro-labeling technique to detect the in-situ deformation and mechanical property of samples in a high-spatial-discrimination scanning microscopic environment.

Description

technical field [0001] The invention belongs to the field of micro-nano mechanics and precision machinery, and in particular relates to a single-axis bidirectional micro-mechanical measuring device and a measuring method for scanning a micro-environment. Background technique [0002] As an important part of the field of micro-nano science, micro-nano mechanical experiments play an important and irreplaceable role in the detection and verification of the mechanical properties of micro-nano-scale materials, structures and devices. Its initial requirements come from the research requirements on the mechanical properties of small-scale materials, from the prediction and analysis of the performance and reliability of MEMS and other micro-scale devices, and from the fine, multi-scale models that can describe the mechanical behavior of complex structural materials verification. In particular, due to the reduction of the characteristic size of materials and structures, new mechanic...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N3/00G01N3/08G01N3/20
Inventor 李喜德崔志国
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products