Drawing method for polycrystalline silicon layer device auxiliary graphs

Abstract

The invention discloses a drawing method for polycrystalline silicon layer device auxiliary graphs. The drawing method includes the steps that a complete design layout of active area layers, a polycrystalline silicon layer, a thick oxide layer and all avoidance layers is obtained; the active area layers overlapped with the polycrystalline silicon layer are selected through the layout logic operation, edges, which are not in contact with the polycrystalline silicon layer, of the active area layers which are overlapped with the polycrystalline silicon layer are screened, the edges are expanded outwards by a first size and a second size sequentially, the value of the second size is larger than that of the first size, and a first polygon and a second polygon are obtained respectively; the part, coinciding with the first polygon, in the second polygon and the part of a prohibiting area of the polycrystalline silicon layer device auxiliary graph are removed, and the first polycrystalline silicon device auxiliary graph is obtained; finally, the first polycrystalline silicon device auxiliary graph is processed after being finished with the logic operation according to a technical node and the photolithographic process capacity, and the second polycrystalline silicon layer device auxiliary graph is formed. Thus, the drawing method can overcome the defect of leak adding due to design negligence, and much precious time is saved for on-time production of products.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a method for drawing auxiliary graphics of a polysilicon layer device. Background technique [0002] With the continuous shrinking of the feature size of integrated circuits, the design size of semiconductor devices (Device) is becoming more and more precise. In the chip manufacturing process, the small errors introduced by gate (Gate) line width control will affect the performance of semiconductor devices. an impact that cannot be ignored. [0003] The processes that have the greatest impact on line width control in the semiconductor manufacturing process include lithography and etching, and the line width after lithography (After Development Inspection Critical Dimension, referred to as ADI CD). In addition to the performance parameters and process conditions of the lithography machine itself, you can also use Optical Proximity Correction (OPC for short), f...

AI Technical Summary

Problems solved by technology

Design version of POLY and all other layers Figure 1 After being transmitted to the semiconductor manufacturing company, after adding redundant graphics, design rule checks and logic operations, the optical proximity correction OPC before the publication of

Images