Laser dual-modulation reflection spectrum detection system based on microscope

A reflection spectrum and detection system technology, applied in the field of laser dual modulation reflection spectrum detection system, to achieve the effect of eliminating the influence of background reflection light

Active Publication Date: 2014-12-03
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

However, the laser modulation technology also has certain limitations, because when the laser is periodically incident on the surface of the sample, the fluorescence emitted by the sample itself will have the same carrier frequency, so the detection signal will include the fluorescence background signal at the same time, in order to overcome the laser modulation technology To solve the fluorescence background problem, it is necessary to introduce laser dual modulation technology that can suppress the fluorescence background. By making the reflection spectrum change and the fluorescence background signal have different carrier frequencies, the two signals can be distinguished during the signal extraction process.

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  • Laser dual-modulation reflection spectrum detection system based on microscope

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Embodiment Construction

[0026] This patent provides a schematic diagram of a nanomaterial laser double modulation reflectance spectrum signal measurement device as shown in figure 1 shown.

[0027] A nanomaterial laser double-modulation reflection spectrum signal measurement device, using laser spectrum double modulation technology, including a single-mode optical fiber 1, a set of imaging amplification system 2, a transflective film 3, a set of laser beam expansion system 4 , a low-frequency chopper 5, a laser 6, a microscope system 7 and a high-frequency chopper 8, wherein the specific parameters of the main components are as follows:

[0028] The single-mode optical fiber 1 is a single-mode optical fiber in the visible light band, covering a wavelength range of 400-680nm, an inner core diameter of 10um, and a cladding diameter of 125um.

[0029] The laser beam expander system uses a Galileo 10x zoom beam expander.

[0030] The output frequency of the low frequency chopper 5 is 33Hz, and the outp...

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Abstract

The invention discloses a laser dual-modulation spectrum system based on a microscope. The laser dual-modulation spectrum system comprises a single-mode optical fiber, an imaging amplification system, a semi-transmittance semi-reflection sheet, a laser beam expanding system, a low-frequency chopper, a laser device, a microscope system and a high-frequency chopper. Laser dual-modulation reflection spectrum measurement on a nano material is carried out in the manner that according to a laser dual-modulation working theory, a white light source modulated by the high-frequency chopper serves as detection light after passing through a microscope lighting system; after being subjected to beam expanding, laser modulated by the low-frequency chopper is used as pumping light; the detection light and the pumping light work on the surface of a sample after passing through a same microscope objective; the single-mode optical fiber serving as a field diaphragm is arranged at a secondary amplified image surface; under motor control, bi-dimensional scanning is carried out on a sample surface to acquire a relevant optical signal. The laser dual-modulation spectrum system based on the microscope can be used for carrying out spectrum detection on a nano level region, is capable of eliminating interference of background reflection light effectively and can be applied to measurement on an optical characteristic spectrum in the micro-nano optical field.

Description

technical field [0001] This patent belongs to the field of spectral analysis technology, and specifically relates to a microscope-based laser double-modulation reflection spectrum detection system, which is used for optical characteristic detection of nanoscale materials such as nanobelts and nanowires. Background technique [0002] Nanomaterials refer to materials in which at least one dimension in the three-dimensional space is in the range of nanometer size or composed of them as basic units. Compared with conventional bulk materials, it has many specific properties, such as: quantum size effect, surface effect, quantum tunneling effect, etc., which make the behavior of atoms and electrons in the surface state very different from those in the interior. , resulting in nanomaterials having new optical properties that the same kind of macroscopic materials do not possess. To study the optical properties of nanomaterials, microscopic techniques are needed. In addition, phot...

Claims

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Application Information

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IPC IPC(8): G01N21/25
Inventor 王玘袁小文孙聊新张波陆卫
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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