Embedded-type PROM test system and achieving method

Abstract

The invention relates to an embedded-type PROM test system and an achieving method which are applied in a ground segment in space camera electronics. The test system includes an upper computer, a testing FPGA, a custom interface and a storage unit. When a test process is carried out, a soft core code generated by a soft core development module and a hard core code generated by a hard core development module are combined by the upper computer and are sent to the testing FPGA. After a debug command being transmitted to the testing FPGA by the upper computer, a resource calling module reads test data of a PROM from the storage unit and then a configuration operation and a testing operation are carried out to a tested PROM through a custom interface module. A test result is returned to the upper computer for completing a function test of the PROM. By means of the system and the method, development time of a PROM testing module is greatly reduced and meanwhile the PROM testing module is higher in reliability. Problems of details in low-level design in writing of a verification module are simplified in the invention so that PROM in different projects and different models can be connected to a system in an embedded manner and tested just by being subjected to reasonable parameter configuration, thereby improving reusability and universality of the design.

Description

technical field [0001] The invention belongs to the technical field of aerospace remote sensors, and relates to an embedded PROM test system and a realization method applied to the ground part of aerospace camera electronics. Background technique [0002] With the advancement of aerospace technology and the further development of aerospace applications, the tasks of aerospace real-time transmission remote sensing camera electronics are becoming more and more complex. In camera electronics, PROM devices are widely used because of the need to store large amounts of data. However, the current testing of PROM and other basic devices and FPGA interface hardware still relies on writing timing test interfaces in hardware languages ​​such as VHDL\Verilog. This development method is more complicated, and the development cycle is long and the verification efficiency is low. Moreover, in the field of aerospace, there are higher requirements for engineering efficiency and ease of use, ...

AI Technical Summary

Problems solved by technology

As verification occupies more and more human resources and time resources in the entire system development, its efficiency and reusability are very low. Therefore, the development of efficient hardware verification technology has become one of the keys to improving the efficiency of building hardware platforms.

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