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In-situ measurement device and method for space charges of dielectric material under electron irradiation

A technology of dielectric material and space charge, applied in measuring devices, measuring electrical variables, instruments, etc., to achieve the effect of eliminating influence, stable work and strong operability

Inactive Publication Date: 2014-12-24
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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Problems solved by technology

[0004] In view of this, the present invention provides an in-situ measurement device and method for space charge of dielectric materials under electron irradiation, which simulates the influence of dielectric materials by space high-energy electron radiation, and solves the problem of weak signal testing and anti-corrosion in the testing process through shielding structure design. Interference and other problems, in-situ measurement of the space charge distribution of the dielectric material

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  • In-situ measurement device and method for space charges of dielectric material under electron irradiation

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[0027] Such as figure 1 Shown is the in-situ measuring device for space charge of dielectric materials under electron irradiation of the present invention, which consists of a vacuum target chamber 1, an electron accelerator 2, a vacuum pumping system 3, an oscilloscope 4, an electroacoustic pulse method measuring system 6, and a sample stage 7. Composed of 8 pulse generators. Among them, the electroacoustic pulse method measurement system 6 is mainly composed of a pulse signal input interface 601, an aluminum shielding shell 602, a protection resistor 603, an aluminum electrode 604, an upper electrode 606, a signal output interface 607, a signal output circuit 608, an insulating pad 609, a piezoelectric The sensor 610 and the bottom electrode 611 are composed.

[0028] The aluminum electrode 604, upper electrode 605, dielectric material sample 5, lower electrode 611, piezoelectric sensor 610 and insulating pad 609 are stacked and connected from top to bottom and then placed ...

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Abstract

The invention discloses an in-situ measurement device and method for space charges of a dielectric material under electron irradiation. The in-situ measurement device and method for the space charges of the dielectric material under electron irradiation are characterized in that an electron accelerator is used for simulating irradiation of high-energy electrons of a space electrified environment on samples to be tested, and meanwhile in-situ measurement is carried out on distribution of the space charges of the dielectric material by using a pulsed electro-acoustic method. The in-situ measurement device mainly comprises the electron accelerator, a vacuum target chamber, a vacuum pumping system and a pulsed electro-acoustic method measurement system. The device can be used for measuring the distribution of the space charges of the dielectric material under high-energy electron irradiation and providing important material characteristic parameters for charging and discharging mechanisms and effect studies of the dielectric material.

Description

technical field [0001] The invention relates to an in-situ measuring device and method for the space charge of a dielectric material under electron irradiation. Background technique [0002] The spacecraft is exposed to the high-energy electron irradiation environment when it is in the GEO orbit. These high-flux high-energy electrons can directly penetrate the shielding layer of the satellite structure and equipment, and enter the dielectric materials such as the circuit board and wire insulation layer inside the satellite. It leads to the deep charge deposition of insulating dielectric materials, which leads to the internal charging effect of dielectric materials such as solar cell array glass cover sheets and thermal control materials. This is one of the important reasons for the abnormal phenomenon of GEO orbiting satellites. The internal charging process of dielectric materials mainly includes: charge deposition, charge transport and charge discharge. Therefore, to study...

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Application Information

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IPC IPC(8): G01R29/24
Inventor 王俊秦晓刚陈益峰李得天杨生胜柳青史亮汤道坦赵呈选
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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