Fourier transform imaging spectrometer adopting lateral shear interference scanning
A Fourier transform and imaging spectrometer technology, which is applied in the field of Fourier transform spectrometers, can solve problems such as changes in the center of mass and moment of inertia, limitations, affecting the normal use of the instrument, and achieves the effect of avoiding error factors and having a concise structure
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[0044] Such as figure 1 As shown, the transverse shear scanning Fourier transform imaging spectrometer is composed of seven parts. Leaf imaging objective lens 2, a CCD area array camera 3; and a moving mirror scanning drive mechanism 4; a set of control system 5; a zero position signal trigger calibration system 6; an image data processor 7. In the following, the present invention will be described in detail in combination with known principles (such as double-beam transverse shear scanning interferometer, Fourier transform of interferogram data, etc.).
[0045] The pyramid-type Michelson transverse shear beam splitter is the core of the interferometer, such as figure 2 As shown, when the interferometer is at the zero position, the corner mirrors M1 and M2 are mirror-symmetrically placed relative to the incident optical axis and the beam splitting surface. When one corner mirror of the interferometer is offset by d in the direction perpendicular to the incident optical axis,...
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