Structure and manufacturing method of photomask read-only memory with low n-type buried source-drain resistance
A technology of read-only memory and source-drain resistance, applied in semiconductor/solid-state device manufacturing, electric solid-state devices, circuits, etc., can solve the problem of narrow current path, large RC delay in reading signal speed, and limited read-only memory of mask type Take current and other issues to achieve the effect of reducing source-drain resistance and increasing depth
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[0020] In order to have a more specific understanding of the technical content, characteristics and effects of the present invention, now in conjunction with the accompanying drawings, the details are as follows:
[0021] The manufacturing method of the photomask type read-only memory of the low N-type buried source-drain resistance of the present invention, its specific process steps are as follows:
[0022] Step 1, forming shallow isolation trenches on the active area of the silicon substrate to isolate the mask-type read-only memory area from peripheral circuits, such as Figure 4 shown.
[0023] Step 2, perform P well implantation in the active area of the mask type ROM to form the active area in the P well, such as Figure 5 (Figure B is the top view after this step is completed).
[0024] Step 3, coating the first photoresist outside the area where the first N-type buried source and drain is to be formed, the distance between the first photoresists, that is, the cr...
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