Structure and manufacturing method of mask read-only memory
A technology of read-only memory and manufacturing method, applied in semiconductor/solid-state device manufacturing, electric solid-state devices, semiconductor devices, etc., can solve the problems of high process cost, small space, poor device uniformity, etc., to reduce manufacturing cost, poor The effect of stabilizing the value and ensuring the uniformity of the process
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[0021] In order to have a more specific understanding of the technical content, characteristics and effects of the present invention, now in conjunction with the accompanying drawings, the details are as follows:
[0022] The manufacturing method of mask type read-only memory of the present invention, its concrete processing steps are as follows:
[0023] Step 1, forming shallow isolation trenches on the active area of the silicon substrate to isolate the mask-type read-only memory area from peripheral circuits, such as image 3 shown.
[0024] Step 2, perform P well implantation in the active area of the mask type ROM to form the active area in the P well, such as Figure 4 (Figure B is the top view after this step is completed).
[0025] Step 3, coating N-type buried source and drain photoresist, exposing, and then performing a high-dose arsenic ion or phosphorus ion implantation with low energy to form N-type buried source and drain, such as Figure 5 shown.
[0026...
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