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Liquid nitrogen horizontal refrigeration device for testing infrared detector Dewar assembly and design method thereof

A technology for testing infrared detectors and components, used in measuring devices, radiation pyrometry, instruments, etc.

Active Publication Date: 2015-12-09
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The invention solves the problem that liquid nitrogen refrigeration is required when the infrared detector Dewar assembly is placed horizontally for spectrum testing, electrical performance testing and system optical correction

Method used

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  • Liquid nitrogen horizontal refrigeration device for testing infrared detector Dewar assembly and design method thereof
  • Liquid nitrogen horizontal refrigeration device for testing infrared detector Dewar assembly and design method thereof
  • Liquid nitrogen horizontal refrigeration device for testing infrared detector Dewar assembly and design method thereof

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Embodiment Construction

[0060] The specific embodiment of the present invention will be described in further detail below in conjunction with accompanying drawing in embodiment:

[0061] This embodiment is to cool down the Dewar assembly of a 512×512 infrared detection device, the heat capacity is 900 joules, the heat load of the Dewar assembly is 600mw during the test operation, and the cooling time for the Dewar is required to be greater than 30 minutes

[0062] One, design result of the present invention is as follows

[0063] ①Design the total amount of liquid nitrogen required according to the heat capacity, heat leakage and cooling time of the dewar assembly of the separate infrared detector

[0064] The heat capacity of the split-type infrared detector Dewar assembly is Q1=900 (unit: Joule); after the heat leakage of Dewar and the Joule heat of the detector work, it is W=0.6 (unit: watt); the cooling time is T=1800 (unit : second); The latent heat of every gram of liquid nitrogen is Q2=99.74 ...

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Abstract

The invention discloses a liquid nitrogen horizontal refrigeration device for testing an infrared detector Dewar assembly and a design method thereof. The device is fit for process performance test of a split type infrared detector Dewar assembly or an integrated type infrared detector Dewar assembly. The device is mainly formed by a liquid nitrogen cavity body wall (1), a liquid nitrogen cavity base (2), an upper cover (3), a vacuum keeping cover (4), a compression nut (5), a Dewar assembly installing flange (6), an extraction valve seat (7), an extraction valve plug (8), a housing (9), a cold finger (10), a transfusion pipe (11), an exhaust gas pipe (12) and a heat coupler (13). In this way, a stable adjusting value of liquid nitrogen flow can be obtained via a given computational formula and a liquid nitrogen flow adjusting rod (16) can be adjusted according to the adjusting value, thereby achieving an objective to control the liquid nitrogen flow. Thus, a problem is solved that liquid nitrogen is required for carrying out refrigeration during spectrum test, electric performance test and optical calibration of systems of a horizontally-arranged infrared detector Dewar assembly.

Description

technical field [0001] The invention relates to infrared detector manufacturing technology and low temperature and refrigeration technology, and specifically refers to a liquid nitrogen horizontal refrigeration device for testing infrared detector Dewar components, which is suitable for spectrum testing and electrical performance testing of infrared detector Dewar components. It is used to cool the infrared detector Dewar assembly when the system is optically corrected, and it is also suitable for other occasions that require liquid nitrogen level refrigeration. Background technique [0002] The preparation technology of infrared detector components is of great significance in the field of aerospace and aviation infrared. With the expansion of wavelength to long wavelength and the improvement of detection sensitivity, infrared detectors must work at deep and low temperatures. Because mechanical refrigeration has the advantages of compact structure, small size, light weight,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/02
Inventor 王小坤夏晨希孙闻李俊曾智江李雪
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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