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Verification and Debugging Based on Programmable Interface

An interface and debugger technology, applied in the field of automatic test equipment, can solve problems such as high cost, complex ATE, and increased debugging difficulty.

Active Publication Date: 2019-11-26
TEXAS INSTR INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because of the relative complexity of integrated circuits, debug and device verification are often time-consuming and involve many iterations of test vectors using ATE
Due to the complexity of ATE, the cost of using ATE to debug the design under test is quite expensive
The difficulty of debugging is further exacerbated by the I / O limitations of the interface used to implement the design under test

Method used

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  • Verification and Debugging Based on Programmable Interface
  • Verification and Debugging Based on Programmable Interface
  • Verification and Debugging Based on Programmable Interface

Examples

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Embodiment Construction

[0009] figure 1 An illustrative computing device 100 is shown in accordance with a preferred embodiment of the present invention. For example, computing device 100 is or incorporates electronic system 129, such as a laptop computer, mobile device, personal digital assistant, personal computer, electronic control "box" or display, electronic test bench, or any other type of electronic system. Computing device 100 may be powered by line current, solar cells, and / or battery (or capacitive) energy storage. In one example, computing device 100 includes a programmable interface-based verification and debugging system that provides a cost-effective solution for enhancing ad hoc network communications.

[0010] In some embodiments, computing device 100 includes a megacell or system-on-chip (SoC) that includes control logic (eg, CPU 112 ) (central processing unit), storage 114 (eg, random access memory (RAM)) and a VDB debugger 110 (eg, an executable software at least partially embod...

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Abstract

In the described instances, the test connector is arranged to communicate with the test design (460) to the test fixture.The programmable logic interface (450) is coupled to the test connector and is arranged to accept the downloadable testing table (454).The download can be downloaded to apply the test vector from the first group of test vectors (444) to the first test control bus (458).Multi -path reuse (462) is arranged to selectively coupling the first test control bus (458) and the second test control bus (464) to the shared test bus (466).Test bus (466) is coupled to the test connector.The second test control bus (464) is arranged to apply the test vector from the second group of test vectors.

Description

technical field [0001] The present invention relates generally to automatic test equipment and, in particular, to verification and debugging based on programmable interfaces. Background technique [0002] Automatic test equipment (ATE) can be used for verification and debugging of many electronic designs, and especially electronic designs implemented using integrated circuits. Because of the relative complexity of integrated circuits, debug and device verification are typically time consuming and involve many iterations of test vectors using ATE. Because of the complexity of ATE, the cost of using ATE to debug the design under test is quite expensive. The difficulty of debugging is further exacerbated by the input / output limitations of the interface used to implement the design under test. Contents of the invention [0003] In the depicted example, the test connector is arranged to communicatively couple the design under test to the test fixture. A programmable logic in...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/263
CPCG06F11/27G06F11/273G06F30/331G01R13/28G01R31/3177G06F9/44G06F30/34
Inventor 安舒尔·高霍尔拉加万德拉·桑塔纳戈帕尔普拉德普·库马尔·巴博
Owner TEXAS INSTR INC