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Ion selection method and device

A technology of ion selection and ion, which is applied in the direction of electron/ion optical device, particle separator tube parts, time-of-flight spectrometer, etc. Ion-selective and highly targeted effects

Active Publication Date: 2017-06-09
高继龙
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Based on this, it is necessary to provide an ion selection method and device for the problem that the traditional technology can only screen out some ions

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  • Ion selection method and device

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Embodiment 1

[0031] In view of the problem that the traditional technology can only screen out some ions, which leads to the decrease of the secondary electron emission ability of MCP in a saturated or supersaturated state for a long time, the present invention provides an ion selection method embodiment 1; figure 1 It is a schematic flow diagram of Example 1 of the ion selection method of the present invention; as figure 1 As shown, the following steps may be included:

[0032] Step S110: Outputting a trigger command according to the delay trigger signal synchronized with the pulse of the time-of-flight mass spectrometer;

[0033] Step S120: Control the pulse parameters according to the trigger instruction, and output a preset pulse; the preset pulse includes a single pulse or a sequence of pulses; the pulse parameters include pulse width and delay time;

[0034] Step S130: Control the pulse power supply module to output high-voltage pulses to the micro-channel plate according to the pre...

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Abstract

The invention relates to an ion selection method and apparatus. The ion selection method comprises steps of: outputting a trigger instruction according to a time-delayed trigger signal synchronous with a time-of-flight mass spectrometer pulse; controlling a pulse parameter according to the trigger instruction and outputting a preset pulse, wherein the preset pulse comprises a single pulse or a pulse sequence, and the pulse parameter comprises pulse width and delay time; enabling a pulse power module to output a high-voltage pulse to a micro-channel plate (MCP) according to the preset pulse; when ions not required to be detected reach the MCP, enabling the operating voltage of the MCP to be at zero potential according to the high-voltage pulse; when ions required to be detected reach the MCP, enabling the operating voltage of the MCP to be at normal operating potential according to the high-voltage pulse in order to respond to the ions required to be detected. The method and the apparatus have good selective pertinence, do not need to reconstruct the structure of an instrument, and directly solve a decrease in secondary electron emission capability at a detector due to the long-term saturation or oversaturation state of the MCP.

Description

technical field [0001] The invention relates to a time-of-flight mass spectrometer, in particular to an ion selection method and device for a time-of-flight mass spectrometer. Background technique [0002] The principle of the micro-channel plate ion detector is that in a vacuum environment, each piece of MCP (micro-channel plate: micro-channel plate) can gain 10 when ions, electrons, photons, etc. hit its surface under the working voltage. 2 ~10 4 The electrons can detect extremely weak current signals and have the characteristics of high sensitivity. However, when the MCP is in a saturated or supersaturated state for a long time, the secondary electron emission capability of the MCP surface layer will decrease, and its gain multiple will decrease rapidly, and its working life will shorten rapidly. In practical applications, a large amount of sample is often encountered, and the carrier gas and sample molecules are ionized at the same time, resulting in a large number of ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/40H01J49/06
CPCH01J49/06H01J49/40
Inventor 谭国斌洪义喻佳俊苏海波刘丹
Owner 高继龙