A nexfet bypass switch based on photovoltaic application

Abstract

Disclosed in the invention is a photovoltaic-application-based NEXFET bypass switch formed by an N-channel NEXFET having an ultra-low conduction drop, a drive control module, and a capacitor. The NEXFET serves as a core part. A C+ terminal of the drive control module is connected with a positive terminal of the capacitor, a G terminal is connected with a grid electrode of the NEXFET, a D- terminal is connected an anode of the NEXFET, and a D+ terminal is connected with a cathode of the NEXFET. The circuit has a bypass switch capacity. The basic working principle of the bypass switch is similar to that of a Schottky diode; the capacitor and the drive control module are used for realizing drive controlling of the NEXFET; and a power NEXFET device is used as a bypass switch of a photovoltaic battery cell. When a hotspot occurs in the photovoltaic battery cell, a current flows through the bypass switch without any blocking; and the bypass switch does not work under the normal situation. According to the invention, the bypass diode has the ultra low conduction drop; the reverse leakage current and the power consumption are extremely low; the temperature characteristic is better; the service life is prolonged; and characteristics are stable.

Description

technical field [0001] The invention relates to the field of semiconductor technology, in particular to a semiconductor device and a manufacturing process, in particular to designing a NEXFET bypass switch based on photovoltaic applications. Background technique [0002] With the widespread application of solar energy, solar energy related industries such as photovoltaic cells have developed rapidly. The photovoltaic panel is composed of a series of photovoltaic cells. Under optimal conditions, all cells are equally irradiated and exposed to the same current level. However, some battery cells may be partially shaded or obscured under normal operation. These shadowed cells limit current generation compared to fully irradiated cells, and in extreme cases, these cells are completely shaded and the current is blocked. In this case, the shaded cell is like a load, and the current generated by the irradiated cell causes an overvoltage, whose value can fully reach the breakdown ...

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Problems solved by technology

This phenomenon is called a "hot spot" and can lead to overheating of the shaded cell and, in some cases, even permanent damage leading to electrical leakage

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