Terahertz-driven sub-femtosecond time-resolved streak camera

Abstract

The invention belongs to the field of ultrafast diagnosis, and particularly relates to a terahertz-driven sub-femtosecond time-resolved streak camera. The camera comprises a femtosecond laser device, a beam splitter, an ultraviolet laser pulse generation device, an electronic gun, a magnetic focusing device, a deflection system, a fluorescent screen and an EBCCD camera; after femtosecond laser emitted by the femtosecond laser device passes through the beam splitter, one femtosecond laser beam enters the ultraviolet laser pulse generation device, and the other femtosecond laser beam enters the deflection system; the electronic gun is used for converting ultraviolet laser pulses generated by the ultraviolet laser pulse generation device into electronic pulses and accelerating the electronic pulses; the magnetic focusing device is installed between the electronic gun and the deflection system; the EBCCD camera is installed at the position, directly facing the fluorescent screen, outside a main vacuum chamber. According to the streak camera, the time characteristics of the non-relativistic and relativistic ultrafast electronic pulses can be detected, and the resolution can reach the magnitude of a few femtoseconds.

Description

Technical field [0001] The invention patent belongs to the field of ultrafast diagnosis, and specifically relates to a sub-femtosecond time-resolved fringe camera driven by terahertz. Background technique [0002] The generation of ultrafast electrons, the manipulation of trajectories, and the characterization of their time characteristics are the key technologies in the field of ultrafast research, and are generally closely related to ultrafast laser technology. [0003] At present, ultrafast optical pulses can reach the order of sub-100fs or even as, and the corresponding ultrafast electronic pulses can also be compressed to the order of hundreds of fs or even several fs. However, the measurement of electronic pulses with this time accuracy is still Faced with challenges. Especially in experiments such as the seed source of X-ray free electron laser, ultrafast electron diffraction and the second scattering of electrons in atoms, a comprehensive understanding of the time characte...

AI Technical Summary

Problems solved by technology

The device uses a radio frequency cavity (rf cavity) to deflect high-energy electrons, but the phase jitter between the radio frequency field and the electron pulse limits the time resolution in the accumulation mode, generally greater than 100fs

At the same time, RF deflection of high-energy electron beams utilizes high-power RF fields, requiring expensive and complex power drive systems

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