Device used for in situ measurement of solvent vapor expansion in polymer thin film

Abstract

The invention relates to the field of high polymer material processing, in particular to a device used for the in situ measurement of solvent vapor expansion in a polymer thin film. The device comprises nitrogen tanks, flow controllers, solvent tanks, a mixing chamber, a sample cavity, a quartz crystal microbalance, a first sample, a second sample and one series of flow controller airflow systems, wherein the first sample is fit to the bottom of the quartz crystal microbalance for measuring an expansion degree; the second sample is arranged above the transparent glass of the bottom center of the sample cavity for epifluorescence imaging; a second nitrogen tank is introduced into the sample cavity through a third flow controller; through the series of flow controller airflow systems, dry nitrogen is introduced into a solvent storage tank to generate solvent vapor in a foaming way, then, the solvent vapor is introduced into the sample cavity, and meanwhile, the air pressure of the solvent vapor is controlled; film thickness before and during solvent vapor annealing is carried out can be obtained through the measurement of a difference value of the resonant frequency of the quartz crystal microbalance when a thin film is in the presence and in the absence.

Description

technical field [0001] The invention relates to the related fields of polymer material processing and material structure characterization, in particular to a device for in-situ measurement of solvent vapor expansion in a polymer film for performing solvent vapor annealing on a polymer sample and measuring its expansion in situ. Background technique [0002] It is well known that polymers will swell when they come into contact with certain liquids or solvent vapors that can coexist with them. The swelling behavior of polymers has been applied in fields such as lithography and ion exchange. The method of swelling to obtain diblock copolymer films with long-range nanoscale order is called solvent vapor annealing (SVA) or solvent annealing. Solvent annealing is a commonly used method for annealing thin films, that is, solvent vapor is used to swell copolymer thin films to endow polymer chains with certain movement capabilities. In recent years, scientists have designed a variet...

AI Technical Summary

Problems solved by technology

[0003] A key technical obstacle to studying the solvent vapor annealing process is the limited ability to monitor the expansion process in situ. Quartz crystal microbalance (QCM) or optical metrology methods are usually used to detect solvent absorption in polymer films, but in the solvent vapor annealing process Important information such as structural changes, structural potential energy heterogeneity, and film mechanical properties cannot be monitored in the film. Grazing incidence X-ray scattering is usually used to study the transparent nanostructures that appear during diblock copolymer expansion, but this The method cannot describe molecular motion in a spatially resolved manner, and currently there is no experimental method that can simultaneously obtain film thickness and structural or dynamic information

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