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Test device for normal spectral emissivity of infrared transparent materials

A technology of spectral emissivity and transparent materials, which is applied in the field of infrared transparent material normal spectral emissivity testing devices, can solve the problems of easy cracking of samples, poor measurement result accuracy, single testable materials, etc., to achieve accurate measurement and ensure accurate measurement , the effect of uniform heating

Active Publication Date: 2019-06-21
HANGZHOU INSTITUTE OF OPTICS AND FINE MECHANICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problems of single testable material, easy cracking of samples under high temperature, and poor accuracy of measurement results in the above-mentioned existing material emissivity testing technology, and propose a normal spectral emissivity testing device for infrared transparent materials. The device has the characteristics of being able to measure multi-wavelength infrared transparent materials, the sample is not easy to be damaged under high temperature, and the measurement result is highly accurate

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  • Test device for normal spectral emissivity of infrared transparent materials
  • Test device for normal spectral emissivity of infrared transparent materials
  • Test device for normal spectral emissivity of infrared transparent materials

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Embodiment 1

[0031] Such as figure 1 and 2 As shown, it can be seen from the figure that the infrared transparent material normal spectral emissivity testing device of the present invention includes a sample heating temperature control subsystem, a vacuum sealing subsystem, a Fourier transform infrared spectrometer 5, a computer 6 and a standard blackbody 4; the sample The heating temperature control subsystem includes CO for heating 2 Laser 1, heating optical path, and CO2 A He-Ne laser 21 and a third movable reflector 25 for calibration of the laser 1 are placed in parallel; the high-temperature and low-radiation sample chamber includes a brass wall 10, a cooling copper pipe 11 installed around the high-temperature and low-radiation sample chamber, and an internal The optical baffle 17 above, the aluminum rod frame 13 and platinum wire 28 fixed on the metal sealed chamber 9 for supporting the sample and the platinum-rhodium thermocouple 14 installed on the aluminum rod frame; Sealing c...

Embodiment 2

[0044] The difference between this embodiment 2 and embodiment 1 is:

[0045] The sample 22 to be tested is a long-wave infrared-transmitting material.

[0046] Replace the beam expander lens 15 of the laser beam spatial domain shaping part with CaF 2 The beam expander lens of material is fixed on the screw hole below the metal sealing chamber 9.

[0047] The above measurement step four is changed to: move the first movable reflector 23 to the heating optical path, so that the laser light emitted by the 1064nm ultraviolet laser 2 passes through the 3 times The frequency converter obtains the 355nm laser, and the 355nm laser is reflected into the heating optical path through the first movable reflector 23, and the sample to be tested is heated, and then measured;

[0048] The present invention first utilizes two different wavelengths of CO 2 For laser 1 and ultraviolet laser 2, just by moving the first movable mirror 23, different lasers can be selected to measure infrared t...

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Abstract

Provided is a device for testing normal spectral emissivities of infrared transparent materials. The device includes a sample heating and temperature-control subsystem, a vacuum sealing subsystem, a Fourier infrared spectrometer, a computer and a standard blackbody. According to the device, accurate measurement of the emissivities of medium-wave, short-wave and long-wave infrared transparent materials at the temperature from 300K to 800K can be achieved, the device has the advantages of being high in utilization rate and easy and convenient to operate, and the spectral emissivities of different kinds of infrared transparent materials at medium and high temperatures can be tested.

Description

technical field [0001] The invention relates to the measurement of thermal physical property parameters of materials, in particular to a test device for normal spectral emissivity of infrared transparent materials. Background technique [0002] Emissivity is a physical quantity that characterizes the radiation characteristics of the surface of various materials. It is defined as the ratio of the radiation ability of the material surface to the radiation ability of a black body at the same temperature. Emissivity testing has a broad application background in the fields of engineering and scientific research, for example, it is of great value in the field of aerospace industry and national defense scientific research. [0003] At present, the more accurate measurement scheme for measuring low-emissivity infrared transparent materials is [High temperature optical of oxide dome materials] proposed by Raymond M. in the United States. The test device they built chooses CO 2 The l...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00
CPCG01J5/0003
Inventor 毛小建胡旭冯明辉姜本学张龙
Owner HANGZHOU INSTITUTE OF OPTICS AND FINE MECHANICS