Miniaturized linear femtosecond laser pulse shape and width measurement device

A femtosecond laser, pulse shape technology, applied in the direction of instruments, can solve the problems of complex optical path adjustment, difficult real-time measurement, complex structure, etc., to achieve the effect of firm and simple structure, easy adjustment, and small measuring device

Inactive Publication Date: 2017-12-22
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
View PDF4 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Both can obtain the amplitude and phase information of ultrashort pulses at the same time, but the pulse reconstruction process of FROG requires multiple algorithm iterations, the calculation is complex, and it is difficult to measure in real time; SPIDER combines spectral coherence and spectral side-cutting methods to real-time pulse measuremen

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Miniaturized linear femtosecond laser pulse shape and width measurement device
  • Miniaturized linear femtosecond laser pulse shape and width measurement device
  • Miniaturized linear femtosecond laser pulse shape and width measurement device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments, but the protection scope of the present invention should not be limited thereby.

[0017] see first figure 1 , it can be seen from the figure that the miniaturized linear femtosecond laser pulse shape width measuring device of the present invention comprises: along the incident beam direction of the pulse to be measured, there are four small hole diaphragm plates 1, an attenuation delay plate 2, and a first convex lens 3 , a third-order nonlinear medium 4, a second convex lens 5, a fiber coupler 6, a single-mode fiber 7 and a spectrometer 8;

[0018] Described four-hole aperture plate 1, first convex lens 3 and second convex lens 5 are on the same optical axis, and four apertures of the same size are arranged on described four-hole aperture plate 1, and four apertures are in a On the four vertices of the square, the center of the square is loca...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Provided is a miniaturized linear femtosecond laser pulse shape and width measurement device, which comprises a four-hole diaphragm plate, an attenuation time-delay sheet, a first convex lens, a third-order non-linear medium, a second convex lens, an optical fiber coupler, a single-mode fiber and a spectrometer, which are arranged in sequence in the beam incident direction of a pulse to be measured. Interference fringes are subjected to analysis and processing through a Fourier transform spectral interference method to reconstruct spectral and phase information of the light to be measured, thereby restoring shape and phase of the pulse to be measured and realizing measurement of shape and width of the femtosecond pulse. The device is based on the characteristic of rectilinear propagation of the light, and has the advantages of being compact in structure, firm and easy to adjust.

Description

technical field [0001] The invention relates to the time-domain pulse shape and phase measurement of femtosecond laser pulses, in particular to a miniaturized linear femtosecond laser pulse shape width measurement device. Background technique [0002] In 1991, Spence et al. invented the Kerr lens mode-locked (KLM) Ti:sapphire femtosecond laser using Ti:sapphire as the gain medium by using the Kerr effect, which greatly promoted the development of femtosecond technology. As this technology is more and more widely used in various fields such as medicine, processing, biology, and chemistry, the measurement of its pulse width has also become a technical problem. At present, the commonly used femtosecond pulse measurement techniques are: Frequency-resolved Optical Switching (FROG) and Self-Referencing Spectral Coherent Reconstruction (SPIDER). Both can obtain the amplitude and phase information of ultrashort pulses at the same time, but the pulse reconstruction process of FROG ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01J11/00
CPCG01J11/00
Inventor 刘军朱晶鑫申雄
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap