Novel maskless photoetching system and technological process thereof
A maskless lithography and exposure system technology, applied in the field of new maskless lithography system and its process flow, can solve the problems of lack of energy monitoring, long exposure time of a single substrate, equipment stability obstacles, etc., to achieve high efficiency Intelligent production and production traceability, highly automated large-scale production applications, and the effect of improving accuracy and stability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0061] In order to make the object, technical solution and advantages of the present invention clearer, the present invention is described below through specific embodiments shown in the accompanying drawings. It should be understood, however, that these descriptions are exemplary only and are not intended to limit the scope of the present invention. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present invention.
[0062] The purpose of the present invention is to provide a maskless lithography equipment with high production capacity, high reliability and large process tolerance, which overcomes the original shortcomings of low processing efficiency of direct writing lithography technology, and integrates maskless Advantages, it provides a method for plate making in silk screen printing, lithographic printing, embossing printing, gravure printing industry, exposure in pr...
PUM
Property | Measurement | Unit |
---|---|---|
Wavelength | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com