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Optimized integration dual-optical path laser ionization effect simulation system

A simulation system and dual optical path technology, applied in teaching models, educational appliances, instruments, etc., can solve the problems of not meeting the radiation dose rate effect laser simulation requirements, expensive wavelength switching costs, etc., to shorten the design cycle, reduce test costs, The effect of improving test efficiency

Pending Publication Date: 2018-03-23
INST OF ELECTRONICS ENG CHINA ACAD OF ENG PHYSICS
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] At present, most of the existing domestic laser simulation systems are single-event effect laser simulation systems, and most of them are single-wavelength test systems. The cost of wavelength switching is expensive and cannot meet the requirements of radiation dose rate effect laser simulation.

Method used

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  • Optimized integration dual-optical path laser ionization effect simulation system
  • Optimized integration dual-optical path laser ionization effect simulation system
  • Optimized integration dual-optical path laser ionization effect simulation system

Examples

Experimental program
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Embodiment Construction

[0029] The examples of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0030] see figure 1 , an optimized and integrated dual optical path laser ionization effect simulation system, including an adjustment base I, a light source II, a dual optical path attenuation module III, a microscopic observation module IV, and a test and storage module V.

[0031] see figure 2 , the adjustment base I is used to stably support the entire simulation system, including leveling screws 26 and guide rails 27 installed longitudinally on the adjustment base, the leveling screws 26 are used to adjust the horizontal position of the adjustment base, and the guide rails 27 are used to adjust the system high.

[0032] see image 3 The light source II is installed on the upper part of the adjustment base I, including a dual-wavelength pulse laser 1 and an optical path lifter 2 installed in a hood; the dual-wavelength pulse laser 1 is used to...

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Abstract

The present invention discloses an optimized integration dual-optical path laser ionization effect simulation system. The system mainly comprises four portions consisting of a dual-wavelength pulse laser, a dual-optical path attenuation module, a microscopic observation module and a test and control module. The system performs optical path and structure optimization of the whole simulation systemon the basis of achieving 532nm and 1064 dual-wavelength output to more flexibly and rapidly perform researching and verification of a semiconductor device radiation dose rate effect in a laboratory condition, especially to simulate sources of radiation such as a gamma ray and the like being acted on the semiconductor device radiation dose rate effect, and is convenient, rapid, convenient, accurate, high in safety, etc. The optimized integration dual-optical path laser ionization effect simulation system can effectively reduce the test cost, can improve the test efficiency and can shorten thedesign period of radiation hardening.

Description

technical field [0001] The invention belongs to the research field of radiation effects of semiconductor devices, in particular to an optimized and integrated double-optical-path laser ionization effect simulation system. Background technique [0002] In many social application scenarios, there are various radiation factors. When radiation factors interact with semiconductor devices, it will cause physical processes such as ionization effect and displacement effect, which will seriously affect the performance of the device and the entire system, and may even make it permanently invalid. Therefore, the research on the influence of radiation effects and the corresponding anti-radiation reinforcement technology are necessary research topics. [0003] In the early days, researchers mainly relied on large-scale ground-based devices such as electron linear accelerators and various radioactive sources to conduct research on radiation effects. However, these large-scale ground rad...

Claims

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Application Information

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IPC IPC(8): G09B23/18G09B23/22
CPCG09B23/18G09B23/22
Inventor 孙鹏李沫汤戈陈飞良马莉代刚张健
Owner INST OF ELECTRONICS ENG CHINA ACAD OF ENG PHYSICS
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