A spliced main lens universal error detection method based on multi-wavelength phase modulation

Abstract

The invention relates to a spliced main lens universal error detection method based on multi-wavelength phase modulation. The method can be applied to universal error detection of a spliced telescopemain lens. The method is characterized by adding particular phase modulation on a sub-lens of a spliced main lens, measuring a group of point spread function (PSF) values of a system by using a detector, processing the group of PSF values to obtain a partial phase difference under a specific wavelength of the spliced lens, repeating the above-mentioned process under different wavelengths to obtainmultiple partial phase differences, and processing the partial phase differences under multiple wavelengths to obtain the universal error of the spliced lens imaging system. The method uses the spatial phase modulator device to perform phase modulation on one sub-lens of a spliced telescope main lens and algorithm retrieval of universal error requires no iterative computing, so that the universalerror of a system can be detected rapidly and accurately. The method employs multi-wavelength information and overcomes the influence of 2 pi fuzziness, thereby greatly increasing the universal errordetection range and precision.

Description

technical field [0001] The invention belongs to the field of optical imaging telescopes, and in particular relates to a method for detecting common phase errors of spliced ​​primary mirrors based on multi-wavelength phase modulation. Background technique [0002] The resolving power of an optical imaging telescope system is proportional to its aperture size. In order to improve the performance of the telescope, both space-based and ground-based telescopes have been developing in the direction of long focal length and large aperture in recent years. However, when the diameter of the primary mirror of the traditional single-aperture telescope system is increased to nearly 10 meters, it is difficult and complex to manufacture due to a series of problems such as material cost, existing process level and rocket launch and delivery technology. It is not realistic to obtain higher resolution by continuing to increase the aperture of a single-aperture telescope. [0003] In order t...

AI Technical Summary

Problems solved by technology

Shaker-Hardman sensors are complex to design and manufacture, costly, and unable to detect complex wavefronts

Wavefront curvature sensors have low measurement accuracy and are not suitable for high-resolution imaging systems

The image-based phase difference method requires complex subsequent iterative algorithms to process images, and the real-time performance is poor

In addition, none of these existing methods can solve the problem of 2π ambiguity

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