A workpiece polishing detection device
A technology for detecting devices and workpieces, applied in measuring devices, optical devices, instruments, etc., can solve problems such as performance mismatch, impact on clamping accuracy, impact on polishing quality and convergence efficiency, etc.
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Embodiment 1
[0031] The surface of the workpiece 7 is a Φ200 optical element with a curved surface. The present invention is used to measure the pose of the workpiece 7 in situ and dynamically measure the surface profile of the workpiece 7 to check the equal normal spacing polishing numerical control program. The bracket 1 is fixedly installed on the end of the machine tool spindle with the rotary table, the machine tool spindle is fixedly connected to the machine tool rotary table, the measuring head 4 and the laser range finder 6 are rotated together with the machine tool rotary table to perform multi-freedom degree detection.
[0032] The measuring head 4 moves downward with the cylinder 3 and reaches the lower limit of the movement of the cylinder 3. The measuring head 4 follows the servo motion of the machine axis. When the probe of the measuring head 4 touches the surface of the workpiece 8, a pulse signal is triggered and the current machine coordinate value is recorded in real time....
Embodiment 2
[0052] The surface of the workpiece 7 is a flat Φ200 optical element, and the present invention is used to measure the pose of the workpiece 7 in situ and dynamically measure the surface profile of the workpiece 7 to check the equal normal spacing polishing numerical control program. The bracket 1 is fixedly installed on the end of the machine tool spindle, and the machine tool spindle is fixedly connected to the Z-axis slide plate of the machine tool. The measuring head 4 and the laser rangefinder 6 translate together with the Z-axis to perform detection in the linear direction.
[0053] Work process is basically the same as embodiment 1, and the main difference is that the number of measurement points is selected , measuring distribution point .
[0054] Using the present invention to measure the pose and dynamically measure the surface profile of the Φ200 optical element with a flat surface, the normal distance error of the full-face area of the workpiece 7 is less tha...
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