A kind of preparation method of mid-wave infrared medium-enhanced metal high-reflection film
A high-reflection film and enhanced film technology, applied in mirrors, instruments, optics, etc., can solve the problems of low environmental reliability of metal films
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Embodiment 1
[0027] The preparation method of the mid-wave infrared medium-enhanced metal high-reflection film in this embodiment includes the following steps:
[0028] Step 1: Soak the absorbent cotton with a mixture of alcohol and ether to clean the mirror to remove surface debris, oil and accessories;
[0029] Step 2: Fix the reflector to the fixture, place the vacuum chamber, and evacuate it. When the pressure in the chamber is 1.8×10 - 2 Pa, heat the substrate to 150°C and keep it warm for 30min;
[0030] Step 3: bombard the mirror with APS source for 6 minutes;
[0031] Step 4: Evaporate the bonding layer silicon monoxide, the vacuum chamber pressure is 4.5×10 -3 Pa, the evaporation rate is 0.5~1.5nm / s, the thickness of the film layer is monitored by the crystal oscillator method, and the thickness is 120nm;
[0032] Step 5: Turn off the heater in the vacuum chamber, cool naturally, evaporate aluminum when the temperature is lower than 50°C, the evaporation rate is 3-10nm / s, the ...
Embodiment 2
[0040] The preparation method of the mid-wave infrared medium-enhanced metal high-reflection film in this embodiment includes the following steps:
[0041] Step 1: Soak the absorbent cotton with a mixture of alcohol and ether to clean the mirror to remove surface debris, oil and accessories;
[0042] Step 2: Fix the reflector to the fixture, place the vacuum chamber, and evacuate it. When the pressure in the chamber is 1.5×10 - 2 Pa, heat the substrate to 150°C and keep it warm for 30min;
[0043] Step 3: bombard the mirror with APS source for 7 minutes;
[0044] Step 4: Evaporate the bonding layer silicon monoxide, the vacuum chamber pressure is 4.2×10 -3 Pa, the evaporation rate is 0.5~1.5nm / s, the thickness of the film layer is monitored by the crystal oscillator method, and the thickness is 140nm;
[0045] Step 5: Turn off the heater in the vacuum chamber, cool naturally, evaporate aluminum when the temperature is lower than 50°C, the evaporation rate is 3-10nm / s, the ...
PUM
| Property | Measurement | Unit |
|---|---|---|
| thickness | aaaaa | aaaaa |
| thickness | aaaaa | aaaaa |
| thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More