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Method for rapidly and accurately monitoring oxidization and reduction properties of glass

A standard glass, accurate technology, applied in the direction of color/spectral characteristic measurement, etc., can solve the problems of large error in detection results, high detection limit, poor repeatability, etc., and achieve the effect of short time, improved detection accuracy and simple operation

Inactive Publication Date: 2018-11-23
IRICO DISPLAY DEVICES
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, the redox property of the glass is monitored by monitoring the relative content of ferrous ions and ferric ions in the glass substrate. However, since the content of ferric ions in the glass substrate is at the ppm level, the content is very small, so some traditional observation methods, such as : X-ray photoelectron spectrometer, Mössbauer spectroscopy and other instrument methods are not suitable for the observation of iron ions in glass substrates due to their time-consuming operation, high cost, and high detection limit; The problem makes the test results have large errors and poor repeatability

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  • Method for rapidly and accurately monitoring oxidization and reduction properties of glass
  • Method for rapidly and accurately monitoring oxidization and reduction properties of glass
  • Method for rapidly and accurately monitoring oxidization and reduction properties of glass

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Embodiment Construction

[0028] The present invention will be further described in detail below in conjunction with specific embodiments, which are explanations of the present invention rather than limitations.

[0029] By preparing a series of different Fe 2+ and Fe 3+ See Table 1 below for the standard glass substrate samples of the unit thickness of the content. Utilize the o-phenanthroline spectrophotometric method to measure the content (unit wt%) of total iron ion (ΣFe) in the standard glass substrate sample, utilize the ammonium thiocyanate spectrophotometric method to measure the ferric ion (Fe) in the standard glass substrate sample 3+ ) content (unit wt%), then according to ΣFe and Fe 3+ The content of Fe was calculated 2+ content.

[0030] The absorption spectra of the series of standard glass substrate samples in the range of 350-1100 nm wave band are measured by an ultraviolet-visible spectrophotometer. Fe in standard glass substrate samples obtained by data fitting 2+ and Fe3+ The ...

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Abstract

The invention provides a method for rapidly and accurately monitoring oxidization and reduction properties of glass. The method comprises the following steps: step 1, preparing a series of standard glass substrate samples with different Fe<2+> and Fe<3+> content and measuring the Fe<2+> content and the Fe<3+> content and an ultraviolet-visible absorption spectrum; fitting to obtain a relation between the Fe<2+> content and an Fe<2+> absorption peak integral area and a relation between the Fe<3+> content and an Fe<3+> absorption peak integral area; step 2, stacking a plurality of glass substrates together and measuring the ultraviolet-visible absorption spectrum; step 3, carrying out integration on absorption peaks of Fe<2+> and Fe<3+> in the ultraviolet-visible absorption spectrum respectively, and calculating the Fe<2+> content and the Fe<3+> content and the ratio of Fe<2+> / Fe<3+> according to the relations between the Fe<2+> and Fe<3+> content and the absorption peak integral areas of the ultraviolet-visible absorption spectrum. According to the method provided by the invention, the oxidization and reduction properties of the glass can be rapidly and accurately monitored, and experiment evidences are provided for controlling raw materials and atmosphere in a glass production process.

Description

technical field [0001] The invention belongs to the field of glass substrate manufacturing, and relates to a method for determining Fe in glass by using ultraviolet-visible spectral absorption method. 2+ and Fe 3+ In order to achieve the purpose of real-time monitoring and control of the oxidation-reduction property of glass in the production process, it specifically relates to a method for quickly and accurately monitoring the oxidation-reduction property of glass. Background technique [0002] The thickness of substrate glass used in flat panel display technology is between 0.3mm and 1.0mm, and it is one of the key components in flat panel displays. Flat panel displays have extremely high requirements for platinum-rhodium and gaseous (such as bubbles, etc.) inclusions in the glass substrate that affect its optics, mechanical strength, thermal stability and surface coating performance. Defect control is especially important. [0003] Among the various production processe...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/31
CPCG01N21/31
Inventor 谢长征祖琳徐莉华
Owner IRICO DISPLAY DEVICES