Molecular marker for identifying fusarium head blight resistance of wheat, and application of molecular marker

A wheat scab and molecular marker technology, applied in the fields of wheat genetics breeding and molecular biology, can solve the problem of high price, and achieve the effects of speeding up the breeding process, improving the accuracy and high amplification efficiency

Active Publication Date: 2019-02-22
JIANGSU ACADEMY OF AGRICULTURAL SCIENCES
View PDF5 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although Liu et al. (2008) developed a molecular marker closely linked to scab resistance QTL, UMN10, although it has obvious advantages in high-throughput detection, it requires

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Molecular marker for identifying fusarium head blight resistance of wheat, and application of molecular marker
  • Molecular marker for identifying fusarium head blight resistance of wheat, and application of molecular marker
  • Molecular marker for identifying fusarium head blight resistance of wheat, and application of molecular marker

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] Example 1 Verification of molecular marker JAASM273 primer pair in resistant varieties

[0033] The templates used in the PCR reaction in this example are: Sumai No. 3, Wangshuibai, Taiwan wheat, Ningmai No. 8, Ningmai No. 9 and Ningmai No. 13, wherein Sumai No. Scab varieties, Taiwan wheat, Ningmai No. 8, Ningmai No. 9 and Ningmai No. 13 are moderately resistant to scab. Jimai 22, Annong 8455, Huaimai 18, Xiaoyan 54, Yangmai 4 and Wanmai 55 are susceptible to scab. The genomic DNA of wheat leaves was extracted by CTAB method, and the genomic DNA was quantified by micro-spectrophotometer Nanodrop.

[0034]When using the software Primer Premier5.0 to design molecular marker primers for variable sites, the primer design software cannot perform sequence comparison and correction, cannot anchor the variable sites, and cannot adjust the base types at the end of the primers. The primer pair P1 (its nucleotide sequence is shown in SEQ ID NO.3 and SEQ ID NO.4 respectively) an...

Embodiment 2

[0040] Example 2 Using molecular marker JAASM273 to identify wheat head blight resistance

[0041] The tested varieties (lines) are 48 wheat varieties in total, including "Ningmai", "Yang (Rad) wheat", "Huaimai", "Wanmai" and "Annong" series. The varieties (lines) are listed in the table 1. The above-mentioned wheat varieties (lines) were detected with the detection method of the molecular marker JAASM273 established in Example 1; at the same time, the detection was performed with the published detection marker Gwm533, and the detection results were recorded as "yes" or "no". If there is a molecular marker JAASM395 (i.e. a DNA fragment with a size of 600 bp obtained after electrophoresis after PCR amplification with the primers shown in SEQ ID NO.1 and SEQ ID NO.2 respectively), then the wheat variety Gibberella If there is no molecular marker JAASM395, it is judged as a wheat variety susceptible to head blight.

[0042] The single-flower dripping method was used for field r...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a molecular marker for identifying fusarium head blight resistance of wheat, and application of the molecular marker. The molecular marker is a DNA band, with the size being 600 bp, obtained by taking DNA of the wheat variety of Sumai No. 3 as a template and through PCR amplification and then electrophoresis of primer pairs with the nucleotide sequence shown as SEQ ID NO.1and SEQ ID NO.2taking the nucleotide sequence shown as SEQ ID NO.1 and SEQ ID NO.2 as primers for PCR amplification and then electrophoresis. The molecular marker can be applied to material screeningof a fusarium head blight resistance material of the wheat and molecular marker-assisted selective breeding, and if the to-be-detected wheat contains the molecular marker, it is determined that the fusarium head blight resistance of the wheat variety at least reaches the moderate resistance level; otherwise, the susceptible fusarium head blight susceptible wheat variety is determined; and the breeding time can be shortened by utilizing the molecular marker to detect, and the molecular marker is suitable for application and promotion.

Description

technical field [0001] The invention belongs to the field of wheat genetic breeding and molecular biology, in particular to a molecular marker for identifying wheat scab resistance and its application. Background technique [0002] Fusarium head blight (Fusarium Head Blight) is a fungal disease of wheat caused by Fusarium graminearum. Due to changes in farming patterns and climate, wheat scab has rapidly spread to other wheat areas such as Huanghuai wheat area and northern wheat area, resulting in reduced production. In addition, wheat grains infected with germs will carry a large amount of mycotoxins, which will cause a certain degree of poisoning to the digestive system and nervous system of humans and livestock after consumption. Breeding disease-resistant varieties is an important way to reduce the damage of wheat scab. [0003] Using molecular markers closely linked to head blight resistance genes or QTLs can screen for head blight resistance in the early stages of pl...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): C12Q1/6895C12N15/11
CPCC12Q1/6895C12Q2600/13
Inventor 吴磊张旭姜朋何漪俞立璇马鸿翔
Owner JIANGSU ACADEMY OF AGRICULTURAL SCIENCES
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap