Femtosecond laser processing and monitoring fusion method and device for confocal Raman-LIBS spectrum detection
A technology of femtosecond laser processing and spectral detection, applied in the field of femtosecond laser processing and monitoring fusion, can solve the problems of easy axial drift of samples, in-situ detection of complex shape and performance parameters of samples, etc., and achieve high-resolution monitoring and in-situ detection Effects of imaging, controllability improvement, and processing capability improvement
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Embodiment 1
[0048] Such as figure 1 As shown, the computer 30 performs feedback control on the two-dimensional scanner 20, the precision workbench 10, and the axial scanner 8 to realize the three-dimensional scanning and position adjustment of the processing and monitoring of the sample 9; the femtosecond laser processing system consists of a femtosecond laser 17 , a laser space-time shaping module 18, and a two-dimensional scanner 20; the confocal detection module 13 may be composed of a detection objective lens 14 and an intensity detector 15; and the intensity detector 15 is located at the focus position of the detection objective lens 14.
[0049] The implementation steps of femtosecond laser processing confocal Raman and LIBS spectrum in-situ monitoring method are as follows:
[0050] 1) Place the sample 9 on the precision workbench 10, and the precision workbench 10 drives the sample 9 to perform scanning motion;
[0051] 2) Before processing, use the confocal axial monitoring modu...
Embodiment 2
[0060] Such as figure 2 As shown, the laser space-time shaping module 18 is composed of a space shaper 28 and a time shaper 29, and adjusts the time domain and space domain parameters of the light beam emitted by the femtosecond laser 17, so as to optimize the femtosecond laser processing performance.
[0061] All the other are identical with embodiment 1.
Embodiment 3
[0063] Such as image 3 As shown, before processing, after the sample 9 is placed on the precision workbench 10, the sample 9 is roughly aligned using the microscopic imaging module 34, and the light emitted by the white light source 32 passes through the illumination system 33, the illumination beam splitter 35, and the dichroic After the color mirror B6 and the objective lens 7, parallel light beams are generated to uniformly irradiate the sample 9, and the illumination light reflected by the sample 9 is reflected by the illumination beam splitter 35 and imaged on the CCD 38 through the imaging lens 37, so that the position and imaging area of the sample 9 can be obtained, and then The inclination and position of the sample 9 can be judged.
[0064] All the other are identical with embodiment 1.
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