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Transient imaging method and device for particle distribution in plasma

A plasma, particle distribution technology, applied in the field of plasma physics

Active Publication Date: 2021-02-02
SHANXI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention is to solve the problem of transient imaging of particle distribution in plasma in current plasma physics research

Method used

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  • Transient imaging method and device for particle distribution in plasma
  • Transient imaging method and device for particle distribution in plasma
  • Transient imaging method and device for particle distribution in plasma

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Embodiment Construction

[0021] The distribution imaging of argon atoms in aluminum plasma in an argon environment is taken as an example for illustration.

[0022] Such as figure 1 As shown, on one side of the plasma (aluminum plasma), fiber optics are used to guide the plasma fluorescence into a grating spectrometer equipped with a CCD, and on the other side of the plasma, a beam splitter is used to split the fluorescence emitted by the plasma into two After a beam of fluorescence passes through the first optical 4f system composed of the first lens, the second lens and the first narrow-band filter whose central transmission wavelength is the same as the characteristic spectral line of the particle to be measured, the particle is recorded by the first gated camera Spectral line intensity distribution image, another beam of fluorescence passes through the second optical 4f system composed of the third lens and the fourth lens, and the central transmission wavelength is as close as possible to the cha...

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Abstract

The invention belongs to the field of plasma physics. The transient imaging method of particle distribution in plasma, using a spectrometer to collect the plasma spectrum, selects the particle emission line to be measured as its characteristic line; selects two narrow-band filters according to the measured particles; uses two sets of lenses to form two The optical 4f system, narrow-band filter, and gated camera take pictures of the characteristic spectral lines to obtain the particle spectral line intensity distribution image and the continuous background intensity image, and subtract the continuous The product of the background intensity image and the correction coefficient is used to obtain the particle line intensity distribution image; Gaussian smoothing and Abel inversion based on discrete numerical calculation are performed on the particle line intensity distribution image to complete the conversion from the particle line intensity integral image to the particle distribution image . The invention also relates to a transient imaging device for particle distribution in plasma.

Description

technical field [0001] The invention belongs to the field of plasma physics, and in particular relates to a transient imaging method and device for particle distribution in plasma. Background technique [0002] Plasma is a form of matter mainly composed of electrons, atoms, ions, and molecular groups. It exists widely in the universe and is regarded as the fourth state of matter. After a century of vigorous development, plasma physics has become an independent branch of contemporary physics. Its research scope includes fusion plasma, space plasma, celestial plasma, plasma processing, plasma display, etc., and related achievements Has been widely used in chemical industry, materials, electronics, energy, machinery, national defense, biomedicine, environmental protection and other fields. Understanding and mastering the transient distribution and motion laws of various particles in plasma is the key to promoting human cognition of the universe and realizing controlled nuclear...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/25G03B42/00
CPCG03B42/00G01N21/255
Inventor 赵洋张雷尹王保肖连团贾锁堂
Owner SHANXI UNIV