Two-dimensional ion beam deflection device

A deflection device and ion beam technology, which is applied in the direction of electron/ion optical devices, separation tube electrostatic deflection, particle separator tube parts, etc., can solve the problem of increased dispersion, lateral velocity focal point back shift, and affecting the sensitivity of mass spectrometers and resolution issues, to achieve the effects of reducing distortion and large dispersion, reducing lateral velocity dispersion, and improving the length-to-gap ratio

Pending Publication Date: 2019-05-17
KUSN HEXIN MASS PECTRUM TECH +1
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Problems solved by technology

Ultimately, the difference in lateral velocity causes the focal point to move back and the dispersion to increase, affecting the sensitivity and resolution of the mass spectrometer

Method used

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  • Two-dimensional ion beam deflection device
  • Two-dimensional ion beam deflection device
  • Two-dimensional ion beam deflection device

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Embodiment Construction

[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0023] The invention is used for the interface of the time-of-flight analyzer and other analyzers such as quadrupole rods and ion traps, and uses the electrostatic field to modulate the ion beam drawn from the collision cell, ion trap, etc. into a flat ion beam and introduce it into the time-of-flight analyzer , can reduce angular dispersion. Compared with electrostatic quadrupole rods and circular aperture lenses, it has the advantages of small ion beam distor...

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Abstract

The invention relates to a two-dimensional ion beam deflection device, comprising an x-axis deflection polar plate, a lens polar plate component and a y-axis deflection polar plate; the x-axis deflection polar plate, the lens polar plate component, and the y-axis deflection plate are sequentially arranged along the ion beam transmission direction, a deflection voltage is applied to the x-axis deflection polar plate and the y-axis deflection polar plate, the lens polar plate component is grounded, and the length-to-clearance ratio of the x-axis deflection polar plate and the y-axis deflection polar plate is larger than or equal to 4. According to the two-dimensional ion beam deflection device in the invention, a grounded lens polar plate is additionally arranged between the x-axis deflection plate and the y-axis deflection plate, thereby reducing the field effect while increasing the length of the deflection device; transverse velocity dispersion of the ions can be reduced by applying an appropriate electrostatic field intensity; and the length-to-clearance ratio of the deflector is improved to the maximum extent so as to reduce the electric field penetration and consequently reducethe problems of distortion and large dispersion of the ion beam.

Description

technical field [0001] The invention relates to the technical field of mass spectrometry instruments, in particular to a two-dimensional ion beam deflection device for time-of-flight mass spectrometry. Background technique [0002] In vertical-introduction time-of-flight mass spectrometry, ions enter the mass analyzer through a slit along the direction in which they are accelerated by an electric field placed in the mass analyzer. Vertical introduction can minimize the velocity component of ions in the direction of electric field acceleration, thereby reducing the energy divergence of ions; while the slit restricts the width of the ion beam in the direction of electric field acceleration, thereby reducing the spatial divergence of ions. When coupling other analyzers such as quadrupoles and ion traps with a time-of-flight analyzer, the ion beam entering the time-of-flight analyzer needs to be modulated to be flat and efficiently pass through the entrance slit. In mass spectr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/06H01J49/22
Inventor 黄晓刘毅范荣荣张伟朱辉
Owner KUSN HEXIN MASS PECTRUM TECH
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