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86results about "Tube electrostatic deflection" patented technology

Charged particle analysers and methods of separating charged particles

Methods and analysers useful for time of flight mass spectrometry are provided. A method of separating charged particles comprises the steps of: providing an analyser comprising two opposing mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an axis z, the outer system surrounding the inner and defining therebetween an analyser volume, the mirrors creating an electrical field within the analyser volume comprising opposing electrical fields along z, the strength along z of the electrical field being a minimum at a plane z=0; causing a beam of charged particles to fly through the analyser, orbiting around the z axis within the analyser volume, reflecting from one mirror to the other at least once thereby defining a maximum turning point within a mirror; the strength along z of the electrical field at the maximum turning point being X and the absolute strength along z of the electrical field being less than |X| / 2 for not more than ⅔ of the distance along z between the plane z=0 and the maximum turning point in each mirror; separating the charged particles according to their flight times; and ejecting at least some of the charged particles having a plurality of m / z from the analyser or detecting the at least some of charged particles having a plurality of m / z, the ejecting or detecting being performed after the particles have undergone the same number of orbits around the axis z.
Owner:THERMO FISHER SCI BREMEN

Charged Particle Analysers And Methods Of Separating Charged Particles

Methods and analysers useful for time of flight mass spectrometry are provided. A method of separating charged particles comprises the steps of: providing an analyser comprising two opposing mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an axis z, the outer system surrounding the inner and defining therebetween an analyser volume, the mirrors creating an electrical field within the analyser volume comprising opposing electrical fields along z, the strength along z of the electrical field being a minimum at a plane z=0; causing a beam of charged particles to fly through the analyser, orbiting around the z axis within the analyser volume, reflecting from one mirror to the other at least once thereby defining a maximum turning point within a mirror; the strength along z of the electrical field at the maximum turning point being X and the absolute strength along z of the electrical field being less than |X|/2 for not more than ⅔ of the distance along z between the plane z=0 and the maximum turning point in each mirror; separating the charged particles according to their flight times; and ejecting at least some of the charged particles having a plurality of m/z from the analyser or detecting the at least some of charged particles having a plurality of m/z, the ejecting or detecting being performed after the particles have undergone the same number of orbits around the axis z.
Owner:THERMO FISHER SCI BREMEN

Time of flight mass analyzer having improved mass resolution and method of operating same

A time-of-flight mass analyzer having improved mass resolution without mandating a corresponding increase in instrument size is disclosed. The analyzer includes an ionizer that generates the ions that are to be analyzed. These ions are introduced to an ion flight path, at least a portion of which is aligned with a linear axis. The portion of the ion path that is aligned with the linear axis includes a region having a substantially static electric field with non-linear equipotential field lines that circumvent the linear axis. Ions either enter the substantially static electric field with a velocity component that is directed along the linear axis or have such a velocity component imparted to them once they have been trapped in the substantially static electric field. As a result of the combined effects of the linear velocity component and the non-linear field, the ions make multiple circumnavigating trips about the linear axis as they concurrently travel in the direction of the linear axis. Consequently, the ions travel along a significantly longer flight path when compared to a flight path in which the ions solely travel linearly along the axis. In one embodiment, the concurrent motions of the ions in the direction of the linear axis and along the equipotential field lines about the linear axis define a substantially helical ion trajectory. This provides a larger distance along which ions having close, but different, m / z may be separated in time thereby providing an instrument having higher resolution.
Owner:BECKMAN COULTER INC
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