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89results about "Tube electrostatic deflection" patented technology

A wire electrode based ion guide device

This invention presents a kind of ion guide device comprising multiple layers of stretched wire electrodes crossing in space. These wire electrodes are distributed along a defined ion guiding axis in the ion guide device. Each layer of wire electrodes contains at least two wire electrodes with some distance away from the guiding axis, and rotates with an angle relative to wire electrodes on neighboring layer. The ion guide contains multiple layers of wire electrodes to form a cage-like ion guide tunnel and keeps the mounting framework of those wire electrodes outside of the ion guide tunnel, thus reducing the interference of the gas flows from the ion guide device. A power supply provides voltage to each layer of wire electrodes, creates an electric field which focuses the ions towards the guiding axis.
Owner:SHIMADZU RES LAB SHANGHAI +1

Electrostatic Mass Spectrometer with Encoded Frequent Pulses

A method, apparatus and algorithms are disclosed for operating an open electrostatic trap (E-trap) or a multi-pass TOF mass spectrometer with an extended flight path. A string of start pulses with non equal time intervals is employed for triggering ion packet injection into the analyzer, a long spectrum is acquired to accept ions from the entire string and a true spectrum is reconstructed by eliminating or accounting overlapping signals at the data analysis stage while using logical analysis of peak groups. The method is particularly useful for tandem mass spectrometry wherein spectra are sparse. The method improves the duty cycle, the dynamic range and the space charge throughput of the analyzer and of the detector, so as the response time of the E-trap analyzer. It allows flight extension without degrading E-trap sensitivity.
Owner:LECO CORPORATION

Curved ion guide with varying ion deflecting field and related methods

An ion guide includes a plurality of curved electrodes and an ion deflecting device. The electrodes are arranged about and radially spaced from a central curved axis, and circumscribe a curved ion guide region from an ion entrance to an ion exit. The ion deflecting device may include a device for applying a DC electric field to one or more electrodes in a radial direction. The magnitude of the DC electric field, and thus the ion deflecting force, varies along the curved axis. The ion guide may for example operate as a collision cell or like instrument.
Owner:AGILENT TECH INC

Orthogonal ion injection apparatus and process

An orthogonal ion injection apparatus and process are described in which ions are directly injected into an ion guide orthogonal to the ion guide axis through an inlet opening located on a side of the ion guide. The end of the heated capillary is placed inside the ion guide such that the ions are directly injected into DC and RF fields inside the ion guide, which efficiently confines ions inside the ion guide. Liquid droplets created by the ionization source that are carried through the capillary into the ion guide are removed from the ion guide by a strong directional gas flow through an inlet opening on the opposite side of the ion guide. Strong DC and RF fields divert ions into the ion guide. In-guide orthogonal injection yields a noise level that is a factor of 1.5 to 2 lower than conventional inline injection known in the art. Signal intensities for low m / z ions are greater compared to convention inline injection under the same processing conditions.
Owner:BATTELLE MEMORIAL INST

Charged particle analysers and methods of separating charged particles

Methods and analysers useful for time of flight mass spectrometry are provided. A method of separating charged particles comprises the steps of: providing an analyser comprising two opposing mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an axis z, the outer system surrounding the inner and defining therebetween an analyser volume, the mirrors creating an electrical field within the analyser volume comprising opposing electrical fields along z, the strength along z of the electrical field being a minimum at a plane z=0; causing a beam of charged particles to fly through the analyser, orbiting around the z axis within the analyser volume, reflecting from one mirror to the other at least once thereby defining a maximum turning point within a mirror; the strength along z of the electrical field at the maximum turning point being X and the absolute strength along z of the electrical field being less than |X| / 2 for not more than ⅔ of the distance along z between the plane z=0 and the maximum turning point in each mirror; separating the charged particles according to their flight times; and ejecting at least some of the charged particles having a plurality of m / z from the analyser or detecting the at least some of charged particles having a plurality of m / z, the ejecting or detecting being performed after the particles have undergone the same number of orbits around the axis z.
Owner:THERMO FISHER SCI BREMEN

Techniques for independently controlling deflection, deceleration and focus of an ion beam

Techniques for independently controlling deflection, deceleration, and focus of an ion beam are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus for independently controlling deflection, deceleration, and focus of an ion beam. The apparatus may comprise an electrode configuration comprising a set of upper electrodes disposed above an ion beam and a set of lower electrodes disposed below the ion beam. The set of upper electrodes and the set of lower electrodes may be positioned symmetrically about a central ray trajectory of the ion beam. A difference in potentials between the set of upper electrodes and the set of lower electrodes may also be varied along the central ray trajectory to reflect an energy of the ion beam at each point along the central ray trajectory for independently controlling deflection, deceleration, and focus of an ion beam.
Owner:VARIAN SEMICON EQUIP ASSOC INC

Charged Particle Analysers And Methods Of Separating Charged Particles

Methods and analysers useful for time of flight mass spectrometry are provided. A method of separating charged particles comprises the steps of: providing an analyser comprising two opposing mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an axis z, the outer system surrounding the inner and defining therebetween an analyser volume, the mirrors creating an electrical field within the analyser volume comprising opposing electrical fields along z, the strength along z of the electrical field being a minimum at a plane z=0; causing a beam of charged particles to fly through the analyser, orbiting around the z axis within the analyser volume, reflecting from one mirror to the other at least once thereby defining a maximum turning point within a mirror; the strength along z of the electrical field at the maximum turning point being X and the absolute strength along z of the electrical field being less than |X| / 2 for not more than ⅔ of the distance along z between the plane z=0 and the maximum turning point in each mirror; separating the charged particles according to their flight times; and ejecting at least some of the charged particles having a plurality of m / z from the analyser or detecting the at least some of charged particles having a plurality of m / z, the ejecting or detecting being performed after the particles have undergone the same number of orbits around the axis z.
Owner:THERMO FISHER SCI BREMEN

Method and apparatus for transferring ions from an atmospheric pressure ion source into an ion trap mass spectrometer

An ion transfer assembly for transferring ions from an atmospheric pressure ion source into an ion trap mass spectrometer with reduced random noise during analysis of the transferred ions. A method of reducing noise due to charged particles, undesolvated charged droplets, or ions in an ion trap mass spectrometer connected to an atmospheric pressure ionization source.
Owner:THERMO FINNIGAN

Electrostatic mass spectrometer with encoded frequent pulses

A method, apparatus and algorithms are disclosed for operating an open electrostatic trap (E-trap) or a multi-pass TOF mass spectrometer with an extended flight path. A string of start pulses with non equal time intervals is employed for triggering ion packet injection into the analyzer, a long spectrum is acquired to accept ions from the entire string and a true spectrum is reconstructed by eliminating or accounting overlapping signals at the data analysis stage while using logical analysis of peak groups. The method is particularly useful for tandem mass spectrometry wherein spectra are sparse. The method improves the duty cycle, the dynamic range and the space charge throughput of the analyzer and of the detector, so as the response time of the E-trap analyzer. It allows flight extension without degrading E-trap sensitivity.
Owner:LECO CORPORATION

Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry. A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors. At least one of the electric sectors is associated with an ion optical element. The ion optical elements comprise at least one adjustable electrode, such that the adjustable electrode is able to modify the potential experienced by an ion entering or exiting the electric sector with which it is associated.
Owner:CIPHERGEN BIOSYSTEMS INC

Multi-electrode ion trap

This invention relates generally to multi-reflection electrostatic systems, and more particularly to improvements in and relating to the Orbitrap electrostatic ion trap. A method of operating an electrostatic ion trapping device having an array of electrodes operable to mimic a single electrode is proposed, the method comprising determining three or more different voltages that, when applied to respective electrodes of the plurality of electrodes, generate an electrostatic trapping field that approximates the field that would be generated by applying a voltage to the single electrode, and applying the three or more so determined voltages to the respective electrodes. Further improvements lie in measuring a plurality of features from peaks with different intensities from one or more collected mass spectra to derive characteristics, and using the measured characteristics to improve the voltages to be applied to the plurality of electrodes.
Owner:THERMO FINNIGAN

Device for separating, enriching and detecting ions

A device for separating, enriching and detecting ions comprises: a gas tube, in which a carrier gas flows at a uniform rate; an ion source; multiple electrodes provided in the gas tube and applied with electric voltages respectively, so that at least an electric field is produced along the axis of the gas tube; an ion detector; and an ion extraction channel, by which specific enriched ions will be guided across the side wall of the gas tube toward the ion detector and be analyzed. The device enriches ions utilizing the following characteristic: compound ions with specific ion mobility maintain a dynamic balance for a period of time in a flow field under the combination of a carrier gas and a suitable electrical field against the direction of the carrier gas. Simultaneously, multiple compound particles with different ion motilities can be separated and enriched at positions with different electrical field intensities in a flow field in the same manner. The device also comprises synchronously export latitudinally enriched ions at different positions in a flow field, and performs later mass analysis using a mass spectrometer.
Owner:SHIMADZU RES LAB SHANGHAI

Quasi-planar multi-reflecting time-of-flight mass spectrometer

A multi-reflecting time-of-flight (MR-TOF) mass spectrometer, which includes two quasi-planar electrostatic ion mirrors extended along drift direction (Z) and is formed of parallel electrodes, separated by a field-free region. The MR-TOF includes a pulsed ion source to release ion packets at a small angle to X-direction which is orthogonal to the drift direction Z. Ion packets are reflected between ion mirrors and drift along the drift direction. The mirrors are arranged to provide time-of-flight focusing ion packets on the receiver. The MR-TOF mirrors provide spatial focusing in the Y-direction orthogonal to both drift direction Z and ion injection direction X. In a preferred embodiment, at least one mirror has a feature providing periodic spatial focusing of ion packets in the drift Z-direction.
Owner:LECO CORPORATION

Means for removing unwanted ions from an ion transport system and mass spectrometer

The present invention relates to inductively coupled plasma mass spectrometry (ICPMS) in which a collision cell is employed to selectively remove unwanted artefact ions from an ion beam by causing them to interact with a reagent gas. The present invention provides a first evacuated chamber (6) at high vacuum located between an expansion chamber (3) and a second evacuated chamber (20) containing the collision cell (24). The first evacuated chamber (6) includes a first ion optical device (17). The collision cell (24) contains a second ion optical device (25). The provision of the first evacuated chamber (5) reduces the gas load on the collision cell (24), by minimising the residual pressure within the collision cell (24) that is attributable to the gas load from the plasma source (1). This serves to minimise the formation, or re-formation, of unwanted artefact ions in the collision cell (24).
Owner:THERMO FISHER SCI BREMEN +1

Time of flight mass analyzer having improved mass resolution and method of operating same

A time-of-flight mass analyzer having improved mass resolution without mandating a corresponding increase in instrument size is disclosed. The analyzer includes an ionizer that generates the ions that are to be analyzed. These ions are introduced to an ion flight path, at least a portion of which is aligned with a linear axis. The portion of the ion path that is aligned with the linear axis includes a region having a substantially static electric field with non-linear equipotential field lines that circumvent the linear axis. Ions either enter the substantially static electric field with a velocity component that is directed along the linear axis or have such a velocity component imparted to them once they have been trapped in the substantially static electric field. As a result of the combined effects of the linear velocity component and the non-linear field, the ions make multiple circumnavigating trips about the linear axis as they concurrently travel in the direction of the linear axis. Consequently, the ions travel along a significantly longer flight path when compared to a flight path in which the ions solely travel linearly along the axis. In one embodiment, the concurrent motions of the ions in the direction of the linear axis and along the equipotential field lines about the linear axis define a substantially helical ion trajectory. This provides a larger distance along which ions having close, but different, m / z may be separated in time thereby providing an instrument having higher resolution.
Owner:BECKMAN COULTER INC

Time of flight mass analyzer having improved detector arrangement and method of operating same

A time-of-flight mass analyzer having an improved ion detector arrangement is disclosed. The analyzer includes an ionizer that generates the ions that are to be analyzed. A flight tube accepts the ions provided from the ionizer and constrains the ions to a generally helical ion flight path using a generally static electric field. An ion detector is disposed in the flight tube to intercept ions as the ions travel along the substantially helical ion flight path. At least one timer is provided to determine the flight times of the ions along an ion path that comprises at least the generally helical ion path. The timer is responsive to the impingement of ions on the ion detector.
Owner:BECKMAN COULTER INC

Measurement device used for space ions and neutral atoms

The present invention provides a measurement device used for space ions and neutral atoms. The measurement system comprises an ion deflection system, a neutral atom ionization deflection system, an electrostatic analyzer, a flight time system, an electronics processing unit and a device shell. The back-end electrostatic analyzer, the flight time system and the electronics processing unit are shared to measure the ions generated by ionizing the neutral atoms and the ions radiated from the space directly, the measurement of the space ions and the neutral atoms is integrated in a probe, and the as much as possible measurement parts are shared, so that the weight and the power consumption of the device are reduced furthest, the requirements for the satellite platform resources are also reduced, and the fields to which the device is applied are expanded. The measurement device of the present invention has the wide application demands both in the terrestrial space field and the deep space exploration field.
Owner:NAT SPACE SCI CENT CAS

Electrostatic lenses and systems including the same

A system includes an electrostatic lens positioned between a charged-particle source and a detector. The lens includes: a first electrode having a first aperture in the path and aligned with a first axis; a second electrode in the path between the first electrode and the charged-particle detector, the second electrode having a second aperture positioned in the path and aligned with a second axis parallel to the first axis and displaced from the first axis along a first direction; a third electrode in the path between the first electrode and the second electrode; and a potential generator coupled to the first, second, and third electrodes.; During operation, the potential generator applies first, second, and third potentials to the first, second, and third electrodes, respectively, so that the electrostatic lens directs a beam of charged particles from the charged-particle source propagating along the first axis to propagate along the second axis.
Owner:PERKINELMER HEALTH SCIENCES INC

Electric sector time-of-flight mass spectrometer with adjustable ion optical elements

The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry. A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors. At least one of the electric sectors is associated with an ion optical element. The ion optical elements comprise at least one adjustable electrode, such that the adjustable electrode is able to modify the potential experienced by an ion entering or exiting the electric sector with which it is associated.
Owner:CIPHERGEN BIOSYSTEMS INC

Lateral introduction of ions into RF ion guides

An ion guide system includes an ion guide with pole rods, a device for laterally introducing ion species, and a mass spectrometer for analyzing product ions of reactions between different ion species. The device is configured and positioned such that an RF field with at least two-fold rotational symmetry with respect to the axis is generated. The device includes shortened pole rods and / or further electrodes. The pole rods and the further electrodes have at least two-fold rotational symmetry. The symmetry of the RF field allows ions to travel straight ahead through the ion guide with no hindrance. Such arrangements are particularly suitable for bringing together largely loss-free positive and negative ion species for reacting them. The reactions may be used to fragment multiply charged biopolymer ions by electron transfer or to remove excess charges of multiply charged biopolymer ions.
Owner:BRUKER DALTONIK GMBH & CO KG

Means for removing unwanted ions from an ion transport system and mass spectrometer

The present invention relates to inductively coupled plasma mass spectrometry (ICPMS) in which a collision cell is employed to selectively remove unwanted artefact ions from an ion beam by causing them to interact with a reagent gas. The present invention provides a first evacuated chamber (6) at high vacuum located between an expansion chamber (3) and a second evacuated chamber (20) containing the collision cell (24). The first evacuated chamber (6) includes a first ion optical device (17). The collision cell (24) contains a second ion optical device (25). The provision of the first evacuated chamber (6) reduces the gas load on the collision cell (24), by minimising the residual pressure within the collision cell (24) that is attributable to the gas load from the plasma source (1). This serves to minimise the formation, or re-formation, of unwanted artefact ions in the collision cell (24).
Owner:THERMO FISHER SCI BREMEN

Mass spectrometry

There is provided an ion reflector for use with a mass spectrometer for directing a flow of ions between two distinct axes of travel. The reflector includes an electric field capable of causing a flow of ions focused through a first spatial region to be focused toward a second spatial region, whereby the first and second spatial regions are aligned with respective axes of travel.
Owner:BRUKER DALTONIK GMBH & CO KG

Curved ion guide with varying ion deflecting field and related methods

An ion guide includes a plurality of curved electrodes and an ion deflecting device. The electrodes are arranged about and radially spaced from a central curved axis, and circumscribe a curved ion guide region from an ion entrance to an ion exit. The ion deflecting device may include a device for applying a DC electric field to one or more electrodes in a radial direction. The magnitude of the DC electric field, and thus the ion deflecting force, varies along the curved axis. The ion guide may for example operate as a collision cell or like instrument.
Owner:AGILENT TECH INC

Apparatus and method for investigating and/or modifying a sample

An apparatus and a method for investigating and / or modifying a sample is disclosed. The apparatus comprises a charged particle source, at least one particle optical element forming a charged particle beam of charged particles emitted by said charged particle source. The apparatus further comprises an objective lens which generates a charged particle probe from said charged particle beam. The objective lens defines a particle optical axis. A first electrostatic deflection element is arranged—in a direction of propagation of charged particles emitted by said charged particle source—downstream of the objective lens. The electrostatic deflection element deflecting the charged particle beam in a direction perpendicular to said charged particle optical axis and has a deflection bandwidth of at least 10 MHz.
Owner:CARL ZEISS SMT GMBH

Ion mobility analyzer, combination device thereof, and ion mobility analysis method

An ion mobility analyzer, combination device thereof, and ion mobility analysis method. The ion mobility analyzer comprises an electrode system that surrounds the analytical space and a power device that attaches to the electrode system an ion mobility electric potential field that moves along one space axis. During the process of analyzing mobility of ions to be measured, by always placing the ions to be measured in the moving ion mobility electric potential field, and keeping the movement direction of the ion mobility electric potential field consistent with the direction of the electric field on the ions to be measured within the ion mobility electric potential field, theoretically a mobility path of an infinite length can be formed so as to distinguish ions having mobility or ion cross sections that have very small differences.
Owner:SHIMADZU CORP
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