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6results about "Tube electrostatic deflection" patented technology

An ion separation device and ion separation method

ActiveCN121416398BElectron/ion optical arrangementsTube electrostatic deflection
This application discloses an ion separation device and method, belonging to the field of mass spectrometry analysis technology. The device includes: a mass analyzer comprising three parallel layers: an upper electrode, a lower electrode, and an intermediate support layer; rectangular electrodes are disposed on opposite surfaces of the upper and lower electrodes, all arranged parallel to the length of the upper and lower electrodes, with uniform spacing between adjacent rectangular electrodes; the intermediate support layer serves as a support structure between the upper and lower electrodes, and contains an ion movement space; an ion source and a detector are disposed within the intermediate support layer, the detector receiving ions emitted from the ion source into the ion movement space, enabling the detection of ions with different mass-to-charge ratios; and a voltage module generating a vertical electric field between the upper and lower electrodes, forming a linear potential gradient along the longitudinal direction. This device can efficiently and accurately separate and detect ions with different mass-to-charge ratios.
Owner:HEFEI INSTITUTE OF PHYSICAL SCIENCE CHINESE ACADEMY OF SCIENCES

Magnetic spiral time-of-flight mass spectrometry analysis device and analysis method

The invention relates to the technical field of mass spectrometry, in particular to a magnetic spiral flight time mass spectrometry device and method, and the device comprises an ion optical system, a magnetic field generation system, a flight cavity, an ion detector and a computer control system, the ion optical system adjusts the ion source to enter the flight cavity at a target deflection angle and fly at a target speed under a target magnetic field provided by the target magnetic field system through an electrostatic deflector; the flight cavity has a target vacuum degree, and the ion source flies for a target distance along a spiral track in the flight cavity; a detector is arranged in the flight cavity and used for detecting the flight time of the ion source, and the computer control system is electrically connected with the detector and used for collecting multiple flight times and then generating a time mass spectrum. The structure is simple, only the coil, the vacuum chamber and other basic assemblies are needed, the ion incident angle is adjusted in an electronic mode, and the mass resolution and the analysis speed of the instrument can be dynamically adjusted.
Owner:SUZHOU LABORATORY

Mass spectrometer and method

A charge detection mass spectrometer (CDMS) is described, comprising an electrostatic sector field ion trap (40) and an induced charge detector (400), the electrostatic sector field ion trap (40) configured to at least partially define an ion path through the induced charge detector (400). A method is also described.
Owner:TRUEMASS LTD

Electrostatic deflection convergent energy analyzer, imaging electron spectrometer, reflection imaging electron spectrometer, and spin vector distribution imaging device

ActiveCN115803844BImproved energy resolutionMeasure at the same timeMaterial analysis using wave/particle radiationTube electrostatic deflectionEnergy analyserSpatial image
The present application provides a kind of electrostatic deflection convergent energy analyzer, it has wide receiving angle and high two-dimensional convergent performance, can carry out imaging to two-dimensional real space image or emission angle distribution, and can carry out two-dimensional convergent and imaging under 90 ° deflection relative to the direction of incidence. One or more outer electrodes and multiple inner electrodes are arranged along the shape of two rotors formed on the inner side and outer side of common rotation axis. Among them, the inner surface shape of outer electrode is tapered, the diameter of which decreases towards both ends, and the outer surface shape of inner electrode is tapered, the diameter of which decreases towards both ends. Electron entrance hole and exit hole are formed on the outer electrode at both ends of the rotation axis respectively. Voltage for electron acceleration and deceleration is applied to outer electrode and inner electrode in proportion to the energy of incident electron. Voltage is applied to one or more electrodes except the inner electrode at both ends, which is twice or more than the converted acceleration voltage obtained by converting the energy of electron into acceleration voltage based on the potential of outer electrode where entrance hole is formed.
Owner:INTER UNIV RES INST NAT INST OF NATURAL SCI

Mass spectrometer and method

A charge detection mass spectrometer, CDMS, is described. The CDMS 4, comprises: an electrostatic sector field ion trap 40 and an inductive charge detector 400; wherein the electrostatic sector field ion trap 40 is configured to define, at least in part, an ion path via the inductive charge detector 400. A method is also described.
Owner:TRUEMASS LTD

Charged particle beam deflection device

PendingCN121983501AElectron/ion optical arrangementsTube electrostatic deflectionParticle beamParticle physics
The invention relates to a charged particle beam deflection device. The charged particle beam deflection device comprises a first electrode and a second electrode, the first electrode is provided with a first through hole, and the second electrode is provided with a second through hole. The central axis of the first through hole is a first axis, the central axis of the second through hole is a second axis, and the first axis and the second axis are located on the same plane and form a certain included angle. The first electrode and the second electrode are arranged at an interval, and an area therebetween forms a deflection area. Different voltages are applied to the first electrode and the second electrode respectively, a non-axisymmetric electric field can be formed in the deflection area, and therefore the deflection direction of the charged particle beam penetrating through the deflection area is regulated and controlled. Through an innovatively designed electrode structure and a non-axisymmetric electric field constructed by the electrode structure, integrated regulation and control of particle beam deflection and focusing are realized, neutral particle noise is remarkably inhibited, the signal-to-noise ratio is greatly improved, adhesion pollution of neutral particles on the surface of a downstream device is effectively reduced, and the device has a good application prospect. Therefore, the maintenance period of the equipment is obviously prolonged.
Owner:WEIPU TECHNOLOGY (HUZHOU) CO LTD