Method and device for optimizing thickness of absorption layer of far infrared blocking impurity band detector
A technology for blocking impurities and optimizing methods, which is applied in photometry, instruments, calculations, etc. using electric radiation detectors, and can solve the problem of reduced photoelectric conversion efficiency of far-infrared radiation, reduced photogenerated carrier transport efficiency, and detector production costs. Increase and other problems, to avoid repeated test pieces, optimize the thickness of the absorbing layer, and reduce the cost of research and development
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[0057] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and modifications without departing from the concept of the present invention.
[0058] Such as Figure 1 to Figure 6 As shown, according to the method for optimizing far-infrared blocking impurity band (BIB) detector absorbing layer thickness provided by the present invention, the method obtains BIB detector peak responsivity and production cost with absorbing layer thickness variation by numerical simulation and data fitting law. In order to obtain the highest cost performance of the detector, the quotient of the peak responsivity and the production cost of the detector is defined as the cost performance factor of the detector. The optimal thick...
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