Single quantum dot scanning near-field optical microprobe and system, detection device and method

A scanning near-field optics, single quantum dot technology, applied in the field of scanning probe imaging, can solve the problems of complex imaging conditions, high excitation power, wide spectrum, etc., achieve good imaging resolution, increase signal-to-noise ratio, and luminescence signal-to-noise better effect
CN110426535AActive Publication Date: 2019-11-08HUAZHONG UNIV OF SCI & TECH
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
HUAZHONG UNIV OF SCI & TECH
Publication Date
2019-11-08

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Abstract

The invention relates to the technical field of scanning probe imaging, and discloses a near-field probe and a probe system based on a single quantum dot as well as a detection device and a method based on the probe system. In a single quantum dot scanning near-field optical microprobe, the single quantum dot is loaded to the point of a dielectric needle through electrostatic force or a chemical adhesive as a probe, and the point of the dielectric needle is a conical fiber or an atomic force microscope probe. The near-field probe system can effectively overcome the defect that a traditional scanning near-field optical probe distorts optical properties of samples and is low in signal-to-noise ratio and low in repeatability; the imaging resolution of the single quantum dot near-field probe can reach the same magnitude of single quantum dot dimension, and is generally superior to 10 nanometer space resolution. The detection method is based on fluorescence intensity imaging and fluorescence lifetime imaging, and can sense the physical quantity information of multiple dimensions such as sample shape, material composition and optical near-field distribution.
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Description

technical field

[0001] The invention relates to the technical field of scanning probe imaging, in particular to a preparation technology of a near-field probe based on a single quantum dot. The near-field imaging of the probe is based on the change of local density of states. Background technique

[0002] The development of nanotechnology drives people to continue to advance research to smaller and smaller scales. The existence of the optical diffraction limit makes it impossible for people to optically characterize nanoscale objects using conventional methods, and break the optical diffraction limit to optically characterize nanoscale objects. The near-field scanning optical microscope (SNOM) came into being. As the core probe of SNOM, it can be divided into two types: scattering type and transmission type according to the imaging principle. The transmission-type probe is prepared by designing a nanoscale light-through hole on the scanning probe. The common preparation met...

Claims

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