Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Spin orbit torque magnetic memory

A technology of magnetic memory and magnetic tunnel junction, which is applied in the field of integrated circuit memory chips, can solve the problems that there is no method for reading and writing operations, and no design scheme for storage array units is proposed, so as to achieve flexible adjustment, high reliability, and reduce area effect

Inactive Publication Date: 2020-03-17
SHANGHAI CIYU INFORMATION TECH
View PDF10 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The patent does not propose a feasible memory array unit design, nor does it mention the method of read and write operations

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Spin orbit torque magnetic memory
  • Spin orbit torque magnetic memory
  • Spin orbit torque magnetic memory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that all the drawings of the present invention are in simplified form and use inaccurate scales, and are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention.

[0042] The present invention relates to the circuit design of magnetic random access memory. Spin-orbit torque magnetic random access memory (SOT-MRAM) is a kind of fourth-generation MRAM memory. The present invention provides a SOT-MRAM storage array design method.

[0043] Figure 5 Shown is a schematic diagram of the three-terminal structure formed by the magnetic tunnel junction and the metal electrodes in the magnetic memory of the present invention. The magnetic tunnel junction sequentially incl...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a spin orbit torque magnetic memory. The spin orbit torque magnetic memory comprises a magnetic tunnel junction, a metal electrode, a bit line, a source line, a first word line,a second word line, a first field effect transistor and a second field effect transistor, the metal electrode surface is close to the memory layer of the magnetic tunnel junction; the first field effect transistor is connected with the first word line, the bit line and the first end of the metal electrode; the second end of the metal electrode is connected with the source line; the second field effect transistor is connected with the second word line, the bit line and the magnetic tunnel junction. A storage unit of the magnetic memory adopts field-effect tubes with different sizes to respectively control read-write operation, and the read-write field-effect tubes are arranged in a staggered manner, so that the area is saved. When the magnetic memory performs a read operation, a read current passes through the magnetic tunnel junction; when the magnetic memory performs a write operation, the write current partially flows through the magnetic tunnel junction and partially flows throughthe metal electrode or completely flows through the metal electrode. The spin-orbit magnetic moment memory provided by the invention is helpful for simultaneously realizing high-speed read-write operation, long erasing and writing service life and small size of the memory.

Description

technical field [0001] The invention relates to a storage device, in particular to a spin-orbit moment magnetic memory, and belongs to the technical field of integrated circuit memory chips. Background technique [0002] MRAM is a new memory and storage technology that can be read and written as fast as SRAM / DRAM, and can permanently retain data after power failure like Flash memory. Its economy is quite good, and the silicon area occupied per unit capacity has a great advantage over SRAM, and also has advantages over NOR Flash, which is often used in such chips, and has greater advantages than embedded NOR Flash. Its performance is also quite good, the read and write latency is close to the best SRAM, and the power consumption is the best among various memory and storage technologies. Moreover, unlike DRAM and Flash, MRAM is not compatible with standard CMOS semiconductor processes. MRAM can be integrated into a chip with logic circuits. [0003] The principle of MRAM is ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G11C11/16
CPCG11C11/165G11C11/1657
Inventor 叶力
Owner SHANGHAI CIYU INFORMATION TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products