Etching liquid for copper molybdenum and alloy films as well as preparation method of etching liquid

A technology of alloy film and etching solution, which is applied in the field of etching solution of copper molybdenum and alloy film and its preparation, can solve the problems of increasing the manufacturing cost and manufacturing cycle of display products, and the negative impact on the resolution of display products, etc., achieving excellent Etching precision, environmental friendliness, effect of improving resolution

Active Publication Date: 2020-03-27
CHENGDU ZHONGDIAN PANDA DISPLAY TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the etching process, in order to avoid the corrosion of the metal oxide semiconductor by the etching solution, an etching barrier semiconductor structure is usually used, that is, a semiconductor protective layer is added to ensure that the metal oxide semiconductor is not affected by the etching solution. However, the semiconductor protective layer not only increases the manufacturing cost and manufacturing cycle of display products, but also has a negative impact on the resolution of display products

Method used

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  • Etching liquid for copper molybdenum and alloy films as well as preparation method of etching liquid
  • Etching liquid for copper molybdenum and alloy films as well as preparation method of etching liquid
  • Etching liquid for copper molybdenum and alloy films as well as preparation method of etching liquid

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preparation example Construction

[0052] The second aspect of the present invention is to provide the preparation method of the aforementioned etching solution, comprising: mixing and stirring hydrogen peroxide, hydrogen peroxide stabilizer, amine pH regulator, complexing agent, metal corrosion inhibitor, and water to obtain the method for use in the present invention. Copper molybdenum and alloy film etchant.

[0053] Wherein, the mass percent content of each component in the etching solution is the same as that described above, and will not be repeated here.

[0054] Specifically, hydrogen peroxide can be mixed with water first, and then hydrogen peroxide stabilizers, amine pH regulators, complexing agents, and metal corrosion inhibitors can be added to the mixing system. The order of adding the corrosion inhibitor, complexing agent and metal corrosion inhibitor is not limited.

[0055] The preparation method of the etching solution of the present invention has relatively low technological difficulty, and c...

Embodiment 1

[0061] The etchant of the present embodiment comprises the following components according to mass percentage:

[0062] Hydrogen peroxide 10%

[0063] Hydrogen peroxide stabilizer: malonic acid 1.5%, succinic acid 2.2%, phenylurea 0.2%

[0064] Amine pH regulator: N,N-Diaminoethylethylenediamine 2.8%

[0065] Complexing agent: glutamic acid 3.66%

[0066] Metal corrosion inhibitor: 2-aminopyrimidine 0.05%

[0067] Water: 79.59%

[0068] The above components were mixed and stirred at 32° C. to obtain the etching solution of this embodiment.

[0069] The additives of the etching solution in this embodiment include the following components according to the mass percentage:

[0070] Hydrogen peroxide stabilizer: malonic acid 4.88%, succinic acid 4.57%, phenylurea 0.2%

[0071] Amine pH regulator: N,N-Diaminoethylethylenediamine 6.53%

[0072] Complexing agent: glutamic acid 5.58%

[0073] Metal corrosion inhibitor: 2-aminopyrimidine 0.05%

[0074] Water: 78.19%

[0075] T...

Embodiment 2

[0077] The etchant of the present embodiment comprises the following components according to mass percentage:

[0078] Hydrogen peroxide 12%

[0079] Hydrogen peroxide stabilizer: p-hydroxybenzenesulfonic acid 0.3%, succinic acid 2.16%, phenylurea 0.15% Amine pH regulator: N, N-dihydroxyethylpropylenediamine 2.12%

[0080] Complexing agent: malonic acid 3.66%

[0081] Metal corrosion inhibitor: 3-amino-1,2,4 triazole 0.04%

[0082] Water: 79.57%

[0083] The above components were mixed and stirred at 32° C. to obtain the etching solution of this embodiment.

[0084] The additives of the etching solution in this embodiment include the following components according to the mass percentage:

[0085] Hydrogen peroxide stabilizer: 6.54% succinic acid, 0.2% phenylurea

[0086] Amine pH regulator: N,N-Dihydroxyethylpropylenediamine 7.24%

[0087] Complexing agent: glutamic acid 3.75%

[0088] Metal corrosion inhibitor: 3-amino-1,2,4 triazole 0.1%

[0089] Water: 82.17%

[00...

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Abstract

The invention provides an etching liquid for copper molybdenum and alloy films as well as a preparation method of the etching liquid. The etching liquid is prepared from the components including hydrogen peroxide, a hydrogen peroxide stabilizer, an amine pH regulator, a complexing agent, a metal corrosion inhibitor and the balance water; the amine pH regulator is a compound shown in formula 1 and/or formula 2, R1 and R4 are independently selected from C1-4 alkylene, and R2, R3, R5 and R6 are independently selected from single bonds or C2-4 alkylene. By the aid of the etching liquid, the excellent etching precision can be realized, no damage to metallic oxide IGZO films can be avoided further, the 6Mask technology of IGZO products can be upgraded to the 5Mask technology, the manufacturing cost of the display products can be reduced, and the resolution ratio of the display products can be increased.

Description

technical field [0001] The invention relates to an etching solution, in particular to an etching solution for copper-molybdenum and alloy films and a preparation method thereof, belonging to the technical field of etching. Background technique [0002] At present, in the production process of TFT arrays, in order to meet the requirements of large size, high resolution and driving frequency of liquid crystal display products such as TVs, most of them use etching solution to etch the copper-molybdenum metal layer to generate metal with specific patterns. layer to solve the resistance / capacitance time delay problem in the TFT array substrate. [0003] In the etching process, in order to avoid the corrosion of the metal oxide semiconductor by the etching solution, an etching barrier semiconductor structure is usually used, that is, a semiconductor protective layer is added to ensure that the metal oxide semiconductor is not affected by the etching solution. However, the semicon...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23F1/18C23F1/26
CPCC23F1/18C23F1/26
Inventor 蒋雷李广圣李向峰叶宁黄学勇赵亚雄
Owner CHENGDU ZHONGDIAN PANDA DISPLAY TECH CO LTD
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