Heterojunction device with high conversion efficiency
A heterojunction, high-conversion technology, used in semiconductor devices, electrical components, photovoltaic power generation, etc., can solve the problems of high interface state density and poor lattice matching, and achieve low interface state density, high conversion efficiency, and low Effect of Surface Light Reflection Loss
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Embodiment 1
[0020] Such as figure 1 As shown, the present invention provides a high conversion efficiency heterojunction device, including a p-type crystalline silicon substrate 2, the bottom surface of the p-type crystalline silicon substrate 2 is provided with a back electrode 1, and the p-type crystalline silicon substrate 2 The top surface is stacked with an n-type emission film layer 3 , a transparent conductive layer 4 and a front electrode 5 sequentially from bottom to top, and the top surface of the p-type crystalline silicon substrate 2 has a concave-convex textured structure.
[0021] The back electrode 1 is an Al thin film with a thickness of 0.8 μm, the thickness of the p-type crystalline silicon substrate 2 is 300 μm, the n-type emission layer 3 is a GaN thin film with a thickness of 200 nm, and the transparent conductive layer 4 is an ITO thin film with a thickness of 400 nm. The electrode 5 is an Ag thin film with a thickness of 400 nm.
[0022] Detect and calculate the he...
Embodiment 2
[0024] Such as figure 1 As shown, the present invention provides a high conversion efficiency heterojunction device, including a p-type crystalline silicon substrate 2, the bottom surface of the p-type crystalline silicon substrate 2 is provided with a back electrode 1, and the p-type crystalline silicon substrate 2 The top surface is stacked with an n-type emission film layer 3 , a transparent conductive layer 4 and a front electrode 5 sequentially from bottom to top, and the top surface of the p-type crystalline silicon substrate 2 has a concave-convex textured structure.
[0025] The back electrode 1 is an Al thin film with a thickness of 1.0 μm, the thickness of the p-type crystalline silicon substrate 2 is 400 μm, the n-type emission layer 3 is a GaN thin film with a thickness of 150 nm, and the transparent conductive layer 4 is a GZO thin film with a thickness of 500 nm. The electrode 5 is an Ag thin film with a thickness of 500 nm.
[0026] Detect and calculate the het...
Embodiment 3
[0028] Such as figure 1 As shown, the present invention provides a high conversion efficiency heterojunction device, including a p-type crystalline silicon substrate 2, the bottom surface of the p-type crystalline silicon substrate 2 is provided with a back electrode 1, and the p-type crystalline silicon substrate 2 The top surface is stacked with an n-type emission film layer 3 , a transparent conductive layer 4 and a front electrode 5 sequentially from bottom to top, and the top surface of the p-type crystalline silicon substrate 2 has a concave-convex textured structure.
[0029] The back electrode 1 is an Al thin film with a thickness of 1.2 μm, the thickness of the p-type crystalline silicon substrate 2 is 500 μm, the n-type emission layer 3 is an AlGaAs thin film with a thickness of 100 nm, and the transparent conductive layer 4 is a GZO thin film with a thickness of 600 nm. The electrode 5 is an Ag thin film with a thickness of 400 nm.
[0030] Detect and calculate the...
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Abstract
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