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Ultrahigh resistance value measuring circuit and device for alternating current characteristic detection

A technology of AC characteristics and measuring circuits, which is applied in the direction of high resistance measurement, measuring devices, and measuring electrical variables, etc., can solve problems that cannot fully meet the requirements of the research and development field of infrared photoelectric sensor amplification systems, and achieve rapid measurement and reduce Effects of Price and R&D Costs, Simplification and Manufacturing Costs

Active Publication Date: 2020-05-22
成都优蕊光电科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the DC ultra-high resistance detection instruments on the market cannot fully meet the requirements of the research and development field of infrared photoelectric sensor amplification systems.

Method used

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  • Ultrahigh resistance value measuring circuit and device for alternating current characteristic detection
  • Ultrahigh resistance value measuring circuit and device for alternating current characteristic detection
  • Ultrahigh resistance value measuring circuit and device for alternating current characteristic detection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0019] like figure 1 An ultra-high resistance measurement circuit for AC characteristic detection as shown, including a voltage signal generation circuit DAC for generating a reference sine wave voltage signal for the measurement circuit and a signal amplification circuit for amplifying the current signal of the measurement circuit; the signal amplification circuit It includes an operational amplifier and a negative feedback resistor connected to the operational amplifier. The signal amplification circuit is an ultra-micro AC signal amplification circuit. The resistance of the negative feedback resistor Rfb is 10G ohms to 1000G ohms. The current noise of the operational amplifier OPA is less than or equal to And the input bias current is less than or equal to 1pA. One end of the measured test sample RX is connected to the output end of the voltage signal generation circuit DAC, and the other end is connected to the inverting input end of the operational amplifier OPA. The sta...

Embodiment 2

[0021] Based on the principle of the above-mentioned embodiment, the inventor continuously selects operational amplifiers with different resistance value negative feedback resistors and different current noise coefficients, and in the case of parameters such as bandwidth, gain, and signal-to-noise ratio, optimizes a best implementation mode. That is, on the basis of the above circuit structure, the resistance value of the negative feedback resistor is 100G ohms, the current noise of the operational amplifier is 0.4fA and the input bias current is 0.2pA. Since the 100HZ AC signal needs to be amplified, the bandwidth of the transimpedance amplifier must reach 100HZ. The bandwidth of such a high-gain feedback resistor amplifier circuit is greatly affected by the performance of the op amp, parasitic capacitance of the circuit board and other parameters; at the same time, the resistance of the feedback resistor The value selection is very important. The comprehensive gain and bandwi...

Embodiment 3

[0024] In addition to ensuring the performance of the invention in terms of component selection and PCB design, the electrical connection between the amplifier circuit and the sample to be tested is also very important. The shorter the electrical connection, the shorter the interference noise of the amplifier system will be, and the entire system needs to be fully grounded. Metal shields 50HZ power frequency interference; in addition, the measuring device needs to be highly airtight to shield the influence of atmospheric humidity on the measurement results. Traditional instruments and meters use high-performance triaxial cables to meet the above connection requirements. The core amplifier circuit is shielded separately, and the core amplifier circuit is connected to the shielding tooling of the measurement sample by a triaxial cable. The cost of this method is huge, and the convenience of measurement is not strong. Therefore, based on the above-mentioned measurement circuit, t...

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Abstract

The invention discloses an ultrahigh resistance value measurement circuit and device for alternating current characteristic detection. The circuit comprises a voltage signal generation circuit for generating a reference sine wave voltage signal for a measurement circuit and a signal amplification circuit for amplifying a current signal of the measurement circuit, the signal amplification circuit comprises an operational amplifier and a negative feedback resistor connected to the operational amplifier, and the resistance value of the negative feedback resistor ranges from 10 G ohm to 1000 G ohm. The current noise of the operational amplifier is smaller than or equal to 1, and the input bias current of the operational amplifier is smaller than or equal to 1 pA. Under the alternating-currentmeasurement reference circuit, the amplification circuit is improved, so that the rapid measurement of high resistance can be realized, the scanning measurement of the resistance of a test sample in afrequency domain can be realized, and the research and development designers are helped to rapidly analyze the parasitic parameters of a researched amplification device in the frequency domain.

Description

technical field [0001] The invention relates to the field of resistance measuring devices, in particular to an ultra-high resistance value measuring circuit and device for AC characteristic detection. Background technique [0002] The ultra-high resistance measurement device above 1GΩ is a device that measures pA to fA ultra-weak current at a lower voltage to measure ultra-high resistance. It is widely used in photoelectric sensors, electrochemistry, piezoelectric materials and other fields. It plays an indispensable and important role in research work such as sensor circuit design, process research and development, and material property testing. Taking the infrared photoelectric sensor as an example, since it is necessary to amplify the fA-level ultra-weak photocurrent to the mV-level signal required by ADC and other subsequent processing circuits, it is necessary to use a feedback resistor exceeding 1G ohm in the transimpedance circuit, and some even reach 100G to a resis...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/14
CPCG01R27/14G01R27/025
Inventor 赵越赖正刚曾祥全
Owner 成都优蕊光电科技有限公司
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