Method for identifying plasma configuration based on image processing and probe data processing
A plasma and data processing technology, applied in plasma, electrical components, design optimization/simulation, etc., can solve problems such as large errors, optical path errors, fast probes and image transmission line interference, etc., to reduce noise and improve Accuracy, the effect of improving accuracy
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[0052] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0053] Aiming at the problems existing in the prior art, the present invention provides a method for identifying plasma configuration based on image processing and probe data processing. The present invention will be described in detail below with reference to the accompanying drawings.
[0054] Such as figure 1 As shown, the method for identifying plasma configuration based on image processing and probe data processing provided by the embodiment of the present invention includes the following steps:
[0055] S101: Acquiring an image and identifying diameter information of a plasma jet by a fast probe.
[0056] S102: Dete...
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