Preparation method and preparation device of microsphere probe

Abstract

The invention relates to a preparation method and a preparation device of a microsphere probe. The preparation method comprises the following steps: firstly, preparing a glass slide with microspheresand UV glue drops; arranging a glass slide with microspheres and UV glue drops and a probe cantilever up and down; controlling the tip of the probe cantilever to touch the UV glue drops, separating the glass slide from the probe cantilever, controlling the single dispersed microsphere particles on the glass slide to be in contact with the UV glue drops at the ideal position on the probe cantilever, finally separating the glass slide from the probe cantilever again, and curing the UV glue to obtain the microsphere probe. The preparation device comprises an optical microscope, a glass slide I, amanual three-axis combined table, a probe fixing device and a UV curing lamp. The method is simple and convenient to operate, the device is simple in structure, and the problems that in the prior art, a microsphere probe preparation method is complex in operation, low in preparation success rate, uncontrollable in probe cantilever tip glue content and microsphere position, high in platform building cost and the like are effectively solved.

Description

technical field [0001] The invention belongs to the field of preparation and processing of AFM microsphere probes, and relates to a preparation method and a preparation device of a microsphere probe, in particular to a method for obtaining AFM by sticking microsphere particles on a probe cantilever under an optical microscope Methods and apparatus for microsphere probes. Background technique [0002] Atomic force microscope (AFM) has become an important tool in the field of nanotribology research since its invention, which is used to study the interaction of sample surfaces at the nanoscale and provide accurate information on material properties, such as elasticity, adhesion, surface Potential or surface charge density etc. AFM is most commonly used to quantify the forces exerted by particles as they approach a surface. As an important part of AFM, the AFM probe is usually conical or pyramid-shaped, and the radius of curvature of the tip is in the range of 1-10 nm. Due to...

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Problems solved by technology

However, this technology has several disadvantages: first, because the capillary force between the microsphere and the metal wire is very weak, the success rate of the preparation of the microsphere probe is not high; second, the metal wire must be kept clean to avoid the microsphere Surface pollution; Third, the use of double-wire method to prepare microsphere probes, because the size of the metal wire and the cantilever is too small, it is easy to cause damage to the metal wire and the cantilever

The researchers use a three-dimensional motion platform to operate the probe, fix the probe on a U-shaped fixture made of aluminum foil, and fix the entire fixture and probe on the three-dimensional micro-manipulator arm through a pipette. Drop the microsphere mixture on the chip, and drop a drop of UV glue next to the microsphere drop, first move the cantilever to dip in the UV glue, then slowly approach the target microsphere, and use the viscosity of the glue to complete the production of the microsphere probe, and finally Use a UV glue curing lamp to cure the UV glue on the cantilever. This method requires the preparation of a specific fixture to fix the probe, and the adhesion of microsphere particles and glue cannot be observed during the preparation process.

[0007] Document 3 (Preparation of silica colloidal probes and its application in the measurement of the interaction force between simulated particles [D]. Hebei Normal University, 2009.) discloses the preparation of microsphere probes using a two-way moving platform method, which also Using UV glue to take microsphere particles, this method uses a high-power optical microscope-CCD-computer real-time monitoring system, and uses a three-dimensional operating platform to realize the two-way three-dimensional movement of the cantilever, UV glue and microsphere particles to prepare microsphere probes. The operation is more flexible and convenient. This method cannot observe the glue sticking situation in real time, nor can it control the glue content at the tip of the cantilever and the position of the microsphere particles, and the operation is cumbersome, and the construction cost of the entire preparation platform is high. In addition, due to the lack of a cantilever bending detection device, the cantilever is prone to damage during the preparation process

[0008] In summary, the preparation methods of microsphere probes in the prior art generally have problems such as complex operation, low preparation success rate, uncontrollable glue content at the tip of the probe cantilever and uncontrollable position of microspheres, and high platform construction costs, which need to be solved urgently

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