Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Tantalum target material with preferred orientation, preparation method of tantalum target material and torsion device

A technology of preferential orientation and tantalum target material, which is applied in metal material coating process, ion implantation plating, coating, etc., can solve problems such as uneven target structure, target scrapping, and changing the grain orientation of tantalum ingots. Achieve the effect of realizing preferred orientation, reducing grain size and reducing impurity content

Active Publication Date: 2020-08-11
GANZHOU NONFERROUS METALLURGICAL RES INST
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, during the forging process of the above method, it is easy to press oxides and stains on the surface of the tantalum ingot into the interior of the tantalum ingot, resulting in problems such as uneven internal structure of the target, high impurity content, unstable sputtering speed, and scrapped targets; More critically, forging easily changes the grain orientation of the tantalum ingot, and cannot achieve the preferred orientation of the internal structure of the tantalum ingot. The proportion of texture components with (111) and (100) textures in the target is low.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Tantalum target material with preferred orientation, preparation method of tantalum target material and torsion device
  • Tantalum target material with preferred orientation, preparation method of tantalum target material and torsion device
  • Tantalum target material with preferred orientation, preparation method of tantalum target material and torsion device

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0026] The invention provides a method for preparing a tantalum target with a preferred orientation, comprising the following steps:

[0027] (1) Pickling, annealing, and cooling the tantalum ingot in sequence to obtain a pretreated tantalum ingot; the tantalum ingot is a cylindrical tantalum ingot;

[0028] (2) performing torsion deformation on the pretreated tantalum ingot, the torsion angle of the torsion deformation is greater than or equal to 180°;

[0029] (3) Carry out annealing heat treatment and cooling successively with the tantalum ingot after torsion deformation;

[0030] (4) Repeat steps (2) to (3) 2 to 3 times to obtain a tantalum target body;

[0031] (5) Cut off both ends of the tantalum target blank, and cut the remaining part into sheets to obtain a tantalum target with preferred orientation.

[0032] In the invention, the tantalum ingot is pickled, annealed, heat-treated and cooled in sequence to obtain a pretreated high-purity tantalum ingot. In the pres...

Embodiment 1

[0044] (1) Select high-purity tantalum ingots smelted by electron beams, the total content of alloy elements and impurity elements in the tantalum ingots is not higher than 5%, the diameter is 300 mm, and the length is 600 mm; the tantalum ingots are pickled, and the pickling solution is chemical Pure hydrofluoric acid;

[0045] (2) Perform annealing heat treatment on the pickled tantalum ingot, the annealing temperature is 800°C, the holding time is 30min, and it is cooled with the furnace;

[0046] (3) Clamp the tantalum ingot after annealing heat treatment figure 2 Twisting in the twisting device shown, the twisting method is reverse rotation at both ends, and the rotation angle is 180°;

[0047] (4) Perform annealing heat treatment on the twisted tantalum ingot, the heat treatment temperature is 800°C, the holding time is 30min, and it is cooled with the furnace;

[0048] (5) Repeat steps (3) to (4) twice to obtain a tantalum target body with a preferred orientation;

...

Embodiment 2

[0053] Others are the same as in Embodiment 1, only the torsion angle of step (3) is changed to 360°.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Grain sizeaaaaaaaaaa
Login to View More

Abstract

The invention relates to the technical field of target material preparation, and provides a tantalum target material with preferred orientation, a preparation method of the tantalum target material and a torsion device. According to the method, the internal texture orientation of a tantalum ingot is controlled through torsional deformation, tangential deformation in the diameter direction is generated in the tantalum ingot through torsion, and then the internal texture direction of the tantalum ingot is directionally changed, so that the purpose of controlling the material texture is achieved.Through torsional deformation, the uniformity of a target material structure can be improved, the grain size of the target material is reduced, and the preferred component proportion of (111) and (100) textures is increased; and the preparation method provided by the invention does not need to forge and roll the tantalum ingot, and the content of impurities mixed into the target material can be reduced. The invention further provides the torsion device, the device is simple in structure and easy to operate, and torsion of the tantalum ingot can be achieved by using the device.

Description

technical field [0001] The invention relates to the technical field of target material preparation, in particular to a preferred orientation tantalum target material, a preparation method thereof and a torsion device. Background technique [0002] Physical vapor deposition technology (PVD) is one of the key technologies for preparing high-end semiconductor chips. It can deposit metal or metal compounds in the form of thin films on the surface of silicon wafers or other substrates to prepare high-end semiconductor chips. Physical vapor deposition is completed by sputtering machines, therefore, sputtering targets are key consumables for preparing high-end chips. [0003] The preparation of most existing tantalum targets is mainly achieved by forging and rolling tantalum ingots, and the grain refinement is achieved by controlling the deformation rate and heat treatment, and finally the finished target is obtained. For example, patents with publication numbers CN103572225A, CN1...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): C23C14/34C22F1/18
CPCC23C14/3414C22F1/18
Inventor 陈燕飞赖华生张金祥文小强袁德林王玉香郭春平普建刘雯雯周有池
Owner GANZHOU NONFERROUS METALLURGICAL RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products