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Linear nonlinear correction detection system and method based on harmonic technology

A nonlinear correction and technical technology, applied in the field of environmental optics, can solve the problems of second harmonic spectral signal deformation, nonlinear enhancement of spectral lines, affecting measurement accuracy, etc.

Active Publication Date: 2020-10-27
ANHUI AGRICULTURAL UNIVERSITY
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Problems solved by technology

[0004] In view of the deficiencies in the prior art methods, the present invention proposes a detection system and method for linear nonlinear correction based on harmonic technology, in order to solve the problems caused by the deformation and offset of the second harmonic spectrum signal in harmonic detection. The nonlinear enhancement of the spectral line affects the measurement accuracy, thereby eliminating the nonlinearity of the spectral line and improving the measurement accuracy

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  • Linear nonlinear correction detection system and method based on harmonic technology
  • Linear nonlinear correction detection system and method based on harmonic technology
  • Linear nonlinear correction detection system and method based on harmonic technology

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Embodiment Construction

[0046] In this example, see figure 1 , a detection system for linear nonlinear correction based on harmonic technology, including a laser and a control unit, an optical unit, and a data processing unit;

[0047] The laser and the control unit are composed of a tunable semiconductor laser 1, a laser control module 2, and a signal generator 3; the optical unit is composed of a transceiver telescope 9, a reference optical path and a detection optical path; the data processing unit is composed of a phase-sensitive detection circuit 12, a data processor 13. Composition of display module 14;

[0048] The tunable semiconductor laser 1 is used as a detection light source, and the temperature and current are changed through the laser control module 2, thereby changing the output wavelength of the tunable semiconductor laser 1; so that the tunable semiconductor laser 1 outputs a wavelength near the target absorption line;

[0049] The tunable semiconductor laser 1 scans and modulates t...

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Abstract

The invention discloses a linear nonlinear correction detection system and method based on a harmonic technology. The system comprises a tunable semiconductor laser, a laser control module, a signal generator, a reference light path, a detection light path, a phase-sensitive detection circuit, a data processor, a display module and the like. Through background noise elimination and zero line offset correction, a standard signal corresponding to the second harmonic is obtained through Hitran database fitting, and then adaptive iterative fitting is performed according to an optimal criterion, sothat the asymmetry of the signal is minimized, and the signal after linear asymmetry correction is obtained. The influence of fluctuation, linear asymmetry and the like of zero line offset noise canbe effectively reduced, and the accuracy of gas measurement is improved.

Description

technical field [0001] The invention relates to the field of environmental optics, in particular to a detection system and method for linear nonlinear correction based on harmonic technology proposed for the nonlinear influence of the second harmonic signal. Background technique [0002] Laser spectroscopy uses the "fingerprint" characteristics of molecular spectra to quantitatively analyze gas concentrations and is widely used in gas detection. Wavelength modulation spectroscopy technology uses high-frequency detection signals, which can effectively suppress background noise and improve detection sensitivity. However, when wavelength-modulated laser spectroscopy is used for gas detection in open space, the laser light intensity is inevitably interfered by intensity modulation factors, residual amplitude modulation of the laser, and uncontrollable environmental noise, which causes second harmonic spectral signal deformation, deviation, etc. shift, etc., causing the nonlinea...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/39G01N21/01
CPCG01N21/39G01N21/01G01N2021/0112G01N2021/3513
Inventor 唐七星张玉钧陈东刘路廖娟王玉伟何莹郭楠
Owner ANHUI AGRICULTURAL UNIVERSITY
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