Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An Accurate Calibration Method of Spin Defect Concentration in Diamond

A technology of spin defect and calibration method, which is applied in the direction of material excitation analysis, fluorescence/phosphorescence, instruments, etc., can solve the problems of inability to analyze deep defects, lack of accurate calibration methods, and inaccurate speculation

Active Publication Date: 2022-04-08
ZHEJIANG LAB +1
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The energy and intensity of the photoelectron peak can identify and quantify all surface elements. This analysis method can only achieve surface analysis, but cannot do deep defect analysis;
[0005] (2) Deep molecular structure analysis can be achieved by using Raman spectroscopy, but this analysis can only be a qualitative result, and the stacking of multiple molecular structures can easily cause the molecular structure with a small content to be submerged;
[0006] (3) ICP-AES / OES atomizes the sample and heats it in the plasma to turn the small sample into a single atom, ionize and excite it, and obtain accurate elemental analysis by detecting the emission spectrum. The accuracy of this method is High, but it is only suitable for the measurement of element capacity, and cannot measure specific molecular structures;
[0007] (4) The mass spectrometer is an analysis method that first ionizes the substance, separates it according to the mass-to-charge ratio of the ion, and then measures the intensity of various ion spectrum peaks to achieve the purpose of analysis. This method has high measurement accuracy, but it is only applicable For the measurement of single atoms, molecules or particles, the defect structure in a specific structure cannot be measured; (5) Energy dispersive X-ray spectroscopy realizes sample component analysis by measuring the X-ray spectra of different elements. This analysis method is also a qualitative method
Taking the calibration of the NV color center concentration in diamond as an example, usually for high-concentration NV defects, there are two main ways for researchers to obtain their content information: (1) Obtain the content of N element by mass spectrometry and other methods, and in accordance with the NV color The probability of core formation is about 10:1 to estimate the concentration of NV. This method often causes large calculation errors, because different N element doping and annealing processes will lead to different NV formation probabilities; (2) through the tested The fluorescence intensity of the sample is compared with a single color center to infer the content of the NV color center. Because the excitation light is difficult to be uniform for each color center, the fluorescence lifetime of different color centers is different, and the different NV fluorescence radiation modes are different, resulting in inaccurate speculation
Therefore, there is a lack of accurate calibration methods for specific structural defects

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An Accurate Calibration Method of Spin Defect Concentration in Diamond
  • An Accurate Calibration Method of Spin Defect Concentration in Diamond
  • An Accurate Calibration Method of Spin Defect Concentration in Diamond

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] The present invention will be described in detail below according to the accompanying drawings and preferred embodiments, and the purpose and effect of the present invention will become clearer. It should be understood that the specific embodiments described here are only used to explain the present invention, and are not intended to limit the present invention.

[0038] like figure 1 As shown in a, before the diamond is polarized, the spin direction of the diamond is chaotic, and the particles are not sensitive to the external magnetic field as a whole, and there is no systematic magnetic moment; figure 1 As shown in b, when the diamond spin is polarized, the particle has a residual magnetic moment, which precesses under the action of a magnetic field, and the precession frequency is related to the total moment of the atom.

[0039] like figure 2 As shown, the left figure is a diamond NV defect center, which is formed by pairing an N substitution atom with a C vacanc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an accurate calibration method for the concentration of spin defects in diamond. The method suspends particles containing target defects in a vacuum chamber; then polarizes the spin of the target defects so that the macroscopic particles show magnetic moments; and then measures The precession angular acceleration of the particles in the magnetic field is used to obtain the total torque, and then the effective number of spins and the corresponding spin defect concentration are calculated. The method of the invention can realize accurate measurement of defect concentration in particles, and the method used in the invention can be extended and applied to the research of composite quantum systems such as the coupling of macroscopic objects and spin quantum states.

Description

technical field [0001] The invention relates to the fields of material detection and geomagnetic analysis, in particular to an accurate calibration method for spin defect concentration in diamond. Background technique [0002] In the field of materials science, researchers often need to dope or grow a specific concentration of spin defects in crystal materials to achieve certain specific research requirements. For example, color center defects such as NV color center, SiV color center, and GeV are doped in diamond or silicon carbide (SiC) crystals for sensing, computing, and communication research in the field of quantum science. The content and concentration of doping or generating certain defects in the material are important indicators for judging whether the material preparation meets the requirements. [0003] Several existing mainstream analysis techniques are as follows: [0004] (1) The XPS spectrum is obtained by irradiating a solid surface with an X-ray beam and ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N24/00G01N21/64
CPCG01N24/008G01N21/6402
Inventor 李翠红马园园陈志明蒋静李楠胡慧珠
Owner ZHEJIANG LAB
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products