Application of double-conductive aluminum foil adhesive tape

Abstract

The invention provides application of a double-conductive aluminum foil adhesive tape, and particularly relates to application of the double-conductive aluminum foil adhesive tape in preparation of afilamentous fungus scanning electron microscope sample. The preparation method of the filamentous fungus scanning electron microscope sample comprises the steps of 1 preparing a solid culture medium;2 preparing the double-conductive aluminum foil adhesive tape; 3 carrying out inoculating and inserting; 4 enabling the double-conductive aluminum foil adhesive tape to climb on a sample table; and 5observing the scanning electron microscope. The double-conductive aluminum foil adhesive tape has excellent conductivity, one surface of the double-conductive aluminum foil adhesive tape is provided with colloidal substances, aspergillus oryzae hyphae growing on the colloidal surface can be firmly attached to the surface of the double-conductive aluminum foil adhesive tape, the hyphae are tightlyattached to the double-conductive aluminum foil adhesive tape, and the positions and shapes of the hyphae, sporangium and spores on a carrier sheet cannot be changed, so that a better electron microscope scanning in-situ observation effect is achieved.

Description

technical field [0001] The invention relates to the technical field of scanning electron microscope detection of filamentous fungi, in particular to the application of a double conductive aluminum foil tape, especially the application of a double conductive aluminum foil tape in the preparation of scanning electron microscope samples. Background technique [0002] In situ observation of hyphae, sporangia and spores is an important means to observe the morphology of mycelium, sporangia and spores of filamentous fungi. Although the traditional glass cover slip climbing method can observe the shape of spores and hyphae under the light microscope, the glass sheet is not conductive and has a large area during the scanning electron microscope observation, which often leads to discharge and affects the quality of the electron microscope observation results. Therefore, the glass cover glass with fungal hyphae crawling is generally broken to weaken the discharge phenomenon of the mat...

AI Technical Summary

Problems solved by technology

Although the traditional glass cover slip climbing method can observe the shape of spores and hyphae under the light microscope, the glass sheet is not conductive and has a large area during the scanning electron microscope observation, which often leads to discharge and affects the quality of the electron microscope observation results. Therefore, the glass cover glass crawling with fungal hyphae is generally broken to weaken the discharge phenomenon of the material and increase the conductivity of the material.

However, this operation easily destroys the original shape of the mycelium, and also leads to the breakage of the mycelium and the rupture of the sporangia, resulting in poor observation quality

The patent "CN 104928343 A" discloses a method of sample preparation using aluminum foil as a carrier. The main problems of this method are: the ordinary conductive metal foil has a smooth surface. Short, it is difficult to climb on the aluminum foil, so the amount of mycelium on the aluminum foil is small, which is not conducive to observation; during the sampling process, the aluminum foil needs to be moved, and the mycelium is easy to detach or slip off from the smooth foil, resulting in obvious mycelium when scanning the surface of the electron microscope. Traces that affect observations

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