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Method for testing and screening bad IV curve of Schottky chip

A screening method and chip technology, applied in the direction of single semiconductor device testing, measuring electricity, measuring devices, etc., can solve the problems of increasing customer production costs, not outflowing, and not being able to fully achieve abnormalities

Active Publication Date: 2021-04-23
YANGZHOU YANGJIE ELECTRONIC TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] This kind of detection method cannot fully achieve the effect of abnormal non-flow out, which eventually leads to a reduction in the pass rate of batch products. Customers need to pre-check before use, which increases customer production costs and reduces product production efficiency.

Method used

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  • Method for testing and screening bad IV curve of Schottky chip
  • Method for testing and screening bad IV curve of Schottky chip

Examples

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Embodiment Construction

[0054] The present invention as Figure 1-2 Shown, a kind of test screening method of Schottky chip IV bad curve, comprises the following steps:

[0055] 1) Place the Schottky chip to be tested on the test plate of the probe station, and automatically adjust the level of the Schottky chip through the probe station (easy to locate the first Schottky chip);

[0056] 2) Locate the first die on the Schottky chip through the preset image of the probe station (the Schottky chip has several prepared dies);

[0057] 3) The test disc moves upwards to contact with the test probes on the probe station;

[0058] 4) Through the 1mA current given by the test box on the probe station, judge whether the test probe (tungsten needle) is in contact with the first die;

[0059] 4.1) If the probe station shows that the test probe is in good contact with the first die;

[0060] 4.11) The test box gives a reverse current of 50uA, test the reverse voltage, and the test box records its reverse volt...

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Abstract

The invention discloses a method for testing and screening a bad IV curve of a Schottky chip, and relates to a chip testing process. A test box provides reverse currents of 50 uA, 100 uA and 500 uA, tests reverse voltages, and records reverse voltage values of the reverse voltages as C, A and B respectively; then, the test box gives a reverse current of 1mA, a forward current of 10mA, a forward current of 100mA, a forward current of 1A, a forward current of 3A and a forward current of 5A; the absolute value of |A-B| is calculated, and the absolute value is set as D; and when the numerical value D is larger than 1, the IV curve is bad, and when the numerical value D is smaller than 1, the IV curve is normal. According to the steps of the method, an SBD chip can be quickly and automatically subjected to full inspection, and the probability of curve abnormality generated during use at a client is reduced.

Description

technical field [0001] The invention relates to a chip testing process, in particular to a method for testing and screening Schottky chip IV bad curves. Background technique [0002] After the SBD (Schottky chip) backside process is completed, it is necessary to enter the probe station for electrical testing, to screen out electrical defective products, and to mark them accordingly; during the testing process, different currents and voltages need to be set to test The corresponding parameters are calculated and the purpose of screening is achieved through calculation. [0003] At present, the 370A curve tester is used for random inspection of the IV curve. The detection steps are: [0004] 1. Place the SBD chip on the table of the manual probe station, and turn on the table vacuum; [0005] 2. Adjust the reverse voltage of the 370A detector to 10V or 20V (according to the product type), and adjust the reverse current to 20uA; [0006] 3. Click the die on the chip with the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2601
Inventor 郑晓波赵晓非王毅
Owner YANGZHOU YANGJIE ELECTRONIC TECH CO LTD
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