Large-view-field high-flux high-resolution pathological section analyzer

Abstract

The invention relates to a large-field-of-view high-flux high-resolution pathological section analyzer, which comprises an illumination module for generating monochromatic light, a pathological section fixing module used for fixing and adjusting the position of the pathological section to enable the pathological section to be located at the imaging view position, a data acquisition module used for acquiring interference image information formed by scattered light carrying wavefront information after the monochromatic light passes through the pathological section and transmitted light not carrying pathological section information, and a control processing module used for performing image reconstruction on the interference image information to obtain a reconstructed image, and analyzing the reconstructed image based on a pre-trained pathological section analysis model to obtain an analysis result of the pathological section. According to the pathological section analyzer, the imaging visual field is hundreds of times that of a traditional optical microscope, a pathological section does not need to be dyed, a deep learning network is adopted for analyzing pathological conditions, and the analysis process of the pathological section is simplified.

Description

technical field [0001] The invention belongs to the technical field of medical imaging, and in particular relates to a large-field, high-throughput, and high-resolution pathological slice analyzer. Background technique [0002] The optical examination of the microscopic characteristics of pathological sections is one of the gold standards for diagnosing diseases. Pathological sections are made of lesion tissues of a certain size and made by histopathological methods. Machine cut into thin slices, and then stained with hematoxylin-eosin, further examination of the lesion with a microscope, as well as its development process, and finally make a pathological diagnosis. [0003] When making a diagnosis through pathological slices, it is necessary to use a slice system to observe the slices and then analyze the pathological slices. The existing pathological slice imaging methods and pathological slice analysis processes still have the following deficiencies: (1) The field of view...

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Problems solved by technology

[0003] When making a diagnosis through pathological slices, it is necessary to use a slice system to observe the slices and then analyze the pathological slices. The existing pathological slice imaging methods and pathological slice analysis processes still have the following deficiencies: (1) The field of view of traditional optical microscopy techniques Limiting each other with the resolution, the acquisition of high-resolution images is bound to be accompanied by a small field of view, which will consume a lot of time when a large amount of data is required; in addition, the marking of pathological slices by doctors is a highly repetitive process, which takes a long time The accuracy of the labeling cannot be guaranteed; (2) In the pathological examination process, the section needs to be stained for better observation, which is irreversible and time-consuming; (3) Stimulated Raman microscopy imaging technology can be used for untreated Biological tissues provide fast, label-free, and sub-micron resolution imaging, but the stimulated Raman microscopic imaging technology has a small field of view and a complex system, which is not suitable for clinical use. Although the computational microscopic imaging technology has a large field of view, the super-resolution process requires consume a lot of time

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